Temperature dependence of spin-dependent transport properties of Co2MnSi-based current-perpendicular-to-plane magnetoresistive devices

Temperature dependence of spin-dependent transport properties of Co2MnSi-based current-perpendicular-to-plane magnetoresistive devices
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Co2MnSi基电流垂直于平面磁阻器件的自旋相关输运特性的温度依赖性

DOI:
10.1088/0022-3727/44/6/064009
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发表时间:
2011
期刊:
Journal of Physics D: Applied Physics
影响因子:
--
通讯作者:
Koki Takanashi
Koki Takanashi
中科院分区:
--
文献类型:
--
作者:
Y. Sakuraba;K. Izumi;S. Bosu;Kyosuke Saito;Koki Takanashi

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研究了Co2 MnSi(CMS)/Ag/Co2 MnSi电流垂直于面巨磁阻器件在低于80 K时磁阻比下降的原因。ΔRA的温度依赖性与CMS层厚度无关,表明CMS层中的自旋扩散长度对于低温下MR比的降低不重要。只有在5 ~ 100 K的低温下,才观察到一个小的90°层间交换耦合,这是由Ag间隔层中的Mn杂质相互扩散引起的。一个可能的起源在MR比低于1080 K的减少是由于Mn杂质的磁有序的Ag间隔的自旋扩散长度的急剧减少。
The origin of magnetoresistance (MR) ratio reduction below ∼80 K in Co2MnSi (CMS)/Ag/Co2MnSi current-perpendicular-to-plane giant magnetoresistive devices was investigated. The temperature dependence of ΔRA was independent of the CMS layer thickness, indicating that the spin-diffusion length in the CMS layers is unimportant for the reduction in the MR ratio at low temperatures. A small 90° interlayer exchange coupling, which originated from inter-diffused Mn impurities in the Ag spacer, was observed only at low temperatures from 5 to ∼100 K. A possible origin for the reduction in the MR ratio below ∼80 K is the drastic reduction in the spin-diffusion length of the Ag spacer due to magnetic ordering of the Mn impurities.
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