Extracellular Vesicle Refractive Index Derivation Utilizing Orthogonal Characterization.

Extracellular Vesicle Refractive Index Derivation Utilizing Orthogonal Characterization.
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DOI:
10.1021/acs.nanolett.3c00562
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发表时间:
2023-10-25
期刊:
影响因子:
10.8
通讯作者:
Welsh, Joshua A.
Welsh, Joshua A.
中科院分区:
材料科学1区
文献类型:
--
作者:
Pleet, Michelle L.;Cook, Sean;Tang, Vera A.;Stack, Emily;Ford, Verity J.;Lannigan, Joanne;Do, Ngoc;Wenger, Ellie;Fraikin, Jean-Luc;Jacobson, Steven;Jones, Jennifer C.;Welsh, Joshua A.

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The analysis of small particles, including extracellular vesicles and viruses, is contingent on their ability to scatter sufficient light to be detected. These detection methods include flow cytometry, nanoparticle tracking analysis, and single particle reflective image sensing. To standardize measurements and enable orthogonal comparisons between platforms, a quantifiable limit of detection is required. The main parameters that dictate the amount of light scattered by particles include size, morphology, and refractive index. To date, there has been a lack of accessible techniques for measuring the refractive index of nanoparticles at a single-particle level. Here, we demonstrate two methods of deriving a small particle refractive index using orthogonal measurements with commercially available platforms. These methods can be applied at either a single-particle or population level, enabling the integration of diameter and scattering cross section values to derive the refractive index using Mie theory.
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