Exploring electronic structure of one-atom thick polycrystalline graphene films: a nano angle resolved photoemission study.
Exploring electronic structure of one-atom thick polycrystalline graphene films: a nano angle resolved photoemission study.
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DOI：
10.1038/srep02439
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发表时间：
2013
影响因子：
4.6
通讯作者：
Asensio, Maria C.
中科院分区：
文献类型：
--
作者：
Avila, Jose;Razado, Ivy;Lorcy, Stephane;Fleurier, Romain;Pichonat, Emmanuelle;Vignaud, Dominique;Wallart, Xavier;Asensio, Maria C.
目前，生产大尺寸、连续且无缺陷的石墨烯薄膜的能力是多种应用的主要挑战。尽管石墨烯薄膜的可扩展性与明显的多晶特性密切相关，但到目前为止，只有少数几个实验探索了石墨烯颗粒的电子结构。本文报道了用高分辨角度和横向分辨光电子能谱(Nano-ARPES)研究用化学气相沉积方法在薄铜箔上制备的单原子石墨烯薄膜。我们的结果表明，类Dirac相对论电子光谱的稳健性与所研究的石墨烯薄膜中单晶原始颗粒的尺寸、形状和取向有关。此外，通过逐粒映射这一独特的狄拉克系统的电子动力学，我们表明，单粒隙尺寸比经典ARPES最近报道的多粒隙小80%。
The ability to produce large, continuous and defect free films of graphene is presently a major challenge for multiple applications. Even though the scalability of graphene films is closely associated to a manifest polycrystalline character, only a few numbers of experiments have explored so far the electronic structure down to single graphene grains. Here we report a high resolution angle and lateral resolved photoelectron spectroscopy (nano-ARPES) study of one-atom thick graphene films on thin copper foils synthesized by chemical vapor deposition. Our results show the robustness of the Dirac relativistic-like electronic spectrum as a function of the size, shape and orientation of the single-crystal pristine grains in the graphene films investigated. Moreover, by mapping grain by grain the electronic dynamics of this unique Dirac system, we show that the single-grain gap-size is 80% smaller than the multi-grain gap recently reported by classical ARPES.
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影响因子：
19.6
作者：
Bostwick, Aaron;Ohta, Taisuke;Rotenberg, Eli
通讯作者：
Rotenberg, Eli
影响因子：
3.7
作者：
Kralj, Marko;Pletikosic, Ivo;Vobornik, Ivana
通讯作者：
Vobornik, Ivana
影响因子：
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作者：
Hwang, Choongyu;Siegel, David A.;Lanzara, Alessandra
通讯作者：
Lanzara, Alessandra
影响因子：
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作者：
Bostwick, Aaron;Speck, Florian;Rotenberg, Eli
通讯作者：
Rotenberg, Eli
影响因子：
64.8
作者：
Meyer, Jannik C.;Geim, A. K.;Roth, S.
通讯作者：
Roth, S.