Pump-intensity- and shell-thickness-dependent evolution of photoluminescence blinking in individual core/shell CdSe/CdS nanocrystals.

Pump-intensity- and shell-thickness-dependent evolution of photoluminescence blinking in individual core/shell CdSe/CdS nanocrystals.
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DOI:
10.1021/nl2025272
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发表时间:
2011-12-14
期刊:
影响因子:
10.8
通讯作者:
Htoon H
Htoon H
中科院分区:
材料科学1区
文献类型:
--
作者:
Malko AV;Park YS;Sampat S;Galland C;Vela J;Chen Y;Hollingsworth JA;Klimov VI;Htoon H

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本文系统研究了单个CdSe/CdS核/壳双量子点(NQD)的光致发光(PL)强度和寿命随壳层厚度的变化规律。我们发现,虽然在低泵浦强度PL闪烁薄壳(4-7单层,ML)NQD可以描述为随机切换之间的两个状态的高(ON)和低(OFF)发射率,它的变化的制度与连续分布的ON强度水平在高泵浦功率。在具有中等壳层厚度(10-12 ML)的样品中观察到类似的行为,然而,PL强度没有切换到完全“OFF”状态并保持约100 μ L。30%发射率(“灰色”状态)。此外,我们的数据表明,厚壳(15-19 ML)NQD(“巨人”或g-NQD)的高度稳定,无闪烁PL的特征在于接近完美的泊松统计,对应于一个狭窄的,散粒噪声限制PL强度分布。有趣的是,在这种情况下,PL寿命随着泵浦功率的增加而缩短,并且PL衰减可能偏离单指数。然而,PL强度分布仍然是散粒噪声有限的,表明在实验时间窗口期间在给定的泵浦功率强度下没有显著的量子产率波动。
We report a systematic study of photoluminescence (PL) intensity and lifetime fluctuations in individual CdSe/CdS core/shell nanocrystal quantum dots (NQDs) as a function of shell thickness. We show that while at low pump intensities PL blinking in thin-shell (4–7 monolayers, MLs) NQDs can be described by random switching between two states of high (ON) and low (OFF) emissivities, it changes to the regime with a continuous distribution of ON intensity levels at high pump powers. A similar behavior is observed in samples with a medium shell thickness (10–12 MLs), without however, the PL intensity ever switching to a complete “OFF” state and maintaining ca. 30% emissivity (“gray” state). Further, our data indicate that highly stable, blinking-free PL of thick-shell (15–19 MLs) NQDs (“giant” or g-NQDs) is characterized by nearly perfect Poisson statistics, corresponding to a narrow, shot-noise limited PL intensity distribution. Interestingly, in this case the PL lifetime shortens with increasing pump power and the PL decay may deviate from mono-exponential. However, the PL intensity distribution remains shot-noise limited, indicating the absence of significant quantum yield fluctuations at a given pump power intensity during the experimental time window.
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