Basic solutions of multiple parallel symmetric mode-III cracks in functionally graded piezoelectric/piezomagnetic material plane
Basic solutions of multiple parallel symmetric mode-III cracks in functionally graded piezoelectric/piezomagnetic material plane
复制标题
功能梯度压电/压磁材料平面中多个平行对称III型裂纹的基本解
DOI:
10.1007/s10483-013-1739-6
复制
发表时间:
2013-09
期刊:
影响因子:
--
通讯作者:
lin-zhi wu
中科院分区:
文献类型:
--
作者:
shi-dong pan;zhen-gong zhou;lin-zhi wu
The Schmidt method is adopted to investigate the fracture problem of multiple parallel symmetric and permeable finite length mode-III cracks in a functionally graded piezoelectric/piezomagnetic material plane. This problem is formulated into dual integral equations, in which the unknown variables are the displacement jumps across the crack surfaces. In order to obtain the dual integral equations, the displacement jumps across the crack surfaces are directly expanded as a series of Jacobi polynomials. The results show that the stress, the electric displacement, and the magnetic flux intensity factors of cracks depend on the crack length, the functionally graded parameter, and the distance among the multiple parallel cracks. The crack shielding effect is also obviously presented in a functionally graded piezoelectric/piezomagnetic material plane with multiple parallel symmetric mode-III cracks.
登录
查看更多内容
DOI:
10.1177/1045389x9400500406
发表时间:
1994-07-01
影响因子:
2.7
作者:
AVELLANEDA, M;HARSHE, G
通讯作者:
HARSHE, G
影响因子:
3.6
作者:
Tsung-Lin Wu;Jin H. Huang
通讯作者:
Tsung-Lin Wu;Jin H. Huang
影响因子:
6.6
作者:
Jiangyu Li
通讯作者:
Jiangyu Li
DOI:
10.1016/j.ijsolstr.2004.10.021
发表时间:
2005-06
影响因子:
3.6
作者:
J. Chen;Zhengxing. Liu
通讯作者:
J. Chen;Zhengxing. Liu
影响因子:
4.1
作者:
A. Soh;D. Fang;Kwok-lun Lee
通讯作者:
A. Soh;D. Fang;Kwok-lun Lee