Autonomous Repair Fault Tolerant Dynamic Reconfigurable Device
Autonomous Repair Fault Tolerant Dynamic Reconfigurable Device
复制标题
自主修复容错动态可重构器件
DOI：
10.1093/ietfec/e91-a.12.3612
复制
发表时间：
2008
期刊：
影响因子：
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通讯作者：
Yukihiro Nakamura
中科院分区：
文献类型：
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作者：
Kentaro Nakahara;Shin'ichi Kouyama;T. Izumi;H. Ochi;Yukihiro Nakamura
近年来，可重构器件在小批量生产和试制领域得到广泛应用。它们还有望用于太空开发等关键任务领域，因为系统更新和伪修复可以通过重新配置来远程实现。然而，在传统的可重构设备的情况下，由辐射和阿尔法粒子引起的配置存储器混乱会不可预测地重新配置设备，从而导致致命的系统故障。因此，需要一种针对配置混乱具有高容错能力的可重构设备。在本文中，我们提出了一种容错可重构设备的架构，它可以在不中断系统运行的情况下自行修复配置混乱。该设备由二维“自主修复单元”阵列组成，每个单元都能自主修复其故障。该架构在容错方面具有可扩展性；更细粒度的自主修复单元可提供更高的容错能力。为了确定该架构，我们通过实验分析了细胞的四种自主修复技术。然后，应用两种自主修复技术，简单复用（S.M.）和内存复用（M.M.）；前者用于可编程逻辑，后者用于单元到单元的布线资源。通过评估，我们表明，即使在卫星轨道等恶劣情况下，所提出的设备也能实现超过 10 年的平均寿命，以防止配置混乱。
Recently, reconfigurable devices are widely used in the fields of small amount production and trial production. They are also expected to be utilized in such mission-critical fields as space development, because system update and pseudo-repair can be achieved remotely by reconfiguring. However, in the case of conventional reconfigurable devices, configuration memory upsets caused by radiation and alpha particles reconfigure the device unpredictably, resulting in fatal system failures. Therefore, a reconfigurable device with high fault-tolerance against configuration upsets is required. In this paper, we propose an architecture of a fault-tolerant reconfigurable device that autonomously repairs configuration upsets by itself without interrupting system operations. The device consists of a 2D array of “Autonomous-Repair Cells” each of which repairs its upsets autonomously. The architecture has a scalability in fault tolerance; a finer-grained Autonomous-Repair Cell provides higher fault-tolerance. To determine the architecture, we analyze four autonomous repair techniques of the cell experimentally. Then, two autonomous repair techniques, simple multiplexing (S.M.) and memory multiplexing (M.M.), are applied; the former to programmable logics and the latter to cell-to-cell routing resources. Through evaluation, we show that proposed device achieves more than 10 years average lifetime against configuration upsets even in a severe situation such as a satellite orbit.
DOI：
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发表时间：
2006
期刊：
影响因子：
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作者：
近藤 裕佑;他3名;Kentaro Nakahara
通讯作者：
Kentaro Nakahara
基于具有回滚功能的EDAC的容错动态可重构器件
DOI：
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发表时间：
2006
期刊：
IEICE Trans.on Fundamentals of Electronics, Communications and Computer Sciences Vol.E89-A
影响因子：
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作者：
Noriko Matsumoto;et. al.;Kentaro Nakahara
通讯作者：
Kentaro Nakahara