Decoding the structure of interfaces and impurities in 2D materials by photoelectron holography

Decoding the structure of interfaces and impurities in 2D materials by photoelectron holography
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通过光电子全息术解码二维材料中的界面和杂质结构

DOI:
10.1088/2053-1583/ab3ea8
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发表时间:
2019
期刊:
影响因子:
5.5
通讯作者:
D.V. Vyalikh
D.V. Vyalikh
中科院分区:
材料科学2区
文献类型:
--
作者:
D.Y. Usachov;A.V. Tarasov;F. Matsui;M. Muntwiler;K.A. Bokai;V.O. Shevelev;O.Y. Vilkov;M.V. Kuznetsov;L.V. Yashina;C. Laubschat;A. Cossaro;L. Floreano;A. Verdini;D.V. Vyalikh

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原子级薄材料的性质基本上取决于它们的结构,包括杂质、缺陷和与底层衬底的界面。因此,详细的结构信息与创建具有所需特性的2D材料相关。在这里,我们探索的能力,光电子衍射和全息术的原子薄层的结构分析使用作为例子,如h-BN,石墨烯和改性石墨烯与硼杂质的系统。我们表明,对于平面2D晶体与基板相称的接口,它是可能的可视化的接口和杂质具有高的空间分辨率,并区分可能的非等效结构单元。我们的方法适用于B-掺杂的石墨烯在Ni(1 1 1)和Co(0 0 0 1)表面上已经允许揭示硼浓度的不对称性在两个碳亚晶格,并建立其依赖于所应用的合成程序和所选择的衬底。所得结果表明,这种方法可以广泛应用于各种二维系统的研究,其中界面和缺陷的结构非常重要。
The properties of atomically thin materials essentially depend on their structures, including impurities, defects and interfaces with underlying substrates. Thus, the detailed structural information is relevant for creation of 2D materials with desired properties. Here, we explore the capabilities of photoelectron diffraction and holography for structural analysis of atomically thin layers using as examples such systems as h-BN, graphene, and modified graphene with boron impurities. We show that for planar 2D crystals with commensurate interface to the substrate, it is possible to visualize the interface and impurities with high spatial resolution, and to distinguish possible non-equivalent structural units. Our approach applied to B-doped graphene on Ni (1 1 1) and Co (0 0 0 1) surfaces has allowed to reveal asymmetry of boron concentrations in the two carbon sublattices and established its dependence on the applied synthesis procedure and chosen substrate. The obtained results suggest that such approach can be widely applied for studies of various 2D systems, where the structures of interfaces and defects are of remarkable importance.
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