Transformation of multiple fault models to a unified model for ATPG efficiency enhancement
Transformation of multiple fault models to a unified model for ATPG efficiency enhancement
复制标题
将多种故障模型转化为统一模型，提升ATPG效率
DOI：
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发表时间：
2016
期刊：
影响因子：
--
通讯作者：
Kuen
中科院分区：
文献类型：
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作者：
Cheng;Kuen
本文提出了一种系统的方法，将各种故障模型转换为一个统一的模型，使所有感兴趣的故障可以在一个ATPG运行处理。可以转换的故障模型包括但不限于固定故障、各种类型的桥接故障和单元内部故障。统一模型是攻击者-受害者型桥接故障模型。分别针对单元外部故障和单元内部故障，提出了基于故障和基于模式的转换方法。利用该方法，可以使用ATPG工具桥接故障，同时处理多个故障模型的测试生成问题。因此，总的测试生成时间可以减少，高度紧凑的测试集可以得到。实验结果表明，对于ISCAS'89电路和IWLS'05电路，与分别处理三种故障模型而不进行故障丢弃的方法相比，该方法分别实现了平均54.94%（16.45%）和47.22%（17.51%）的测试向量体积缩减。
This paper presents a systematic approach to transform various fault models to a unified model such that all faults of interest can be handled in one ATPG run. The fault models that can be transformed include, but are not limited to, stuck-at faults, various types of bridging faults, and cell-internal faults. The unified model is the aggressor-victim type of bridging fault model. Two transformation methods, namely fault-based and pattern-based transformations, are developed for cell-external and cell-internal faults, respectively. With the proposed approach, one can use an ATPG tool for bridging faults to deal with the test generation problems of multiple fault models simultaneously. Hence the total test generation time can be reduced and highly compact test sets can be obtained. Experimental results show that on average 54.94% (16.45%) and 47.22% (17.51%) test pattern volume reductions are achieved compared to the method that deals with the three fault models separately without (with) fault dropping for ISCAS'89 andIWLS'05 circuits, respectively.
基于 SMT 的高效 ATPG，可解决互连开路缺陷
DOI：
10.7873/date.2014.138
发表时间：
2014
期刊：
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)
影响因子：
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作者：
Dominik Erb;Karsten Scheibler;Matthias Sauer;Bernd Becker
通讯作者：
Bernd Becker