Apertureless SNOM imaging of the surface phonon polariton waves: what do we measure?
Apertureless SNOM imaging of the surface phonon polariton waves: what do we measure?
复制标题
表面声子极化波的无孔径 SNOM 成像:我们测量什么?
DOI:
10.1007/s00339-013-7869-y
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发表时间:
2013
期刊:
影响因子:
--
通讯作者:
Ryssel
中科院分区:
文献类型:
--
作者:
Kazantsev;Ryssel
The apertureless scanning near-field microscope (ASNOM) mapping of surface phonon polariton (SPP) waves being excited at the surface of the SiC polar crystal at a frequency corresponding to the lattice resonance was investigated. The wave with well-defined direction and source position, as well as a well-known propagation law, was used to calibrate the signal of an ASNOM. An experimental proof is presented showing that the signal collected by the ASNOM in such a case is proportional (as a complex number) to the local field amplitude above the surface, regardless of the tip response model.It is shown that the expression describing an ASNOM response, which is, in general case, rather complicated nonlinear function of a surface/tip dielectric constants, wavelength, tip vibration amplitude, tip shape etc., can be dramatically simplified in the case of the SPP waves mapping in a mid-IR range, due to a lucky combination of the tip and surface parameters for the case being considered. A tip vibration amplitude is much less than a running SPP wave field decay height in a normal direction. At the same time, the tip amplitude is larger than a characteristic distance at which a tip–surface electromagnetic near-field interaction plays a significant role.
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影响因子:
3.8
作者:
Brehm, M.;Schliesser, A.;Keilmann, F.
通讯作者:
Keilmann, F.
影响因子:
--
作者:
BARRON, TH
通讯作者:
BARRON, TH
影响因子:
4
作者:
Y. Chabal;A. Sievers
通讯作者:
A. Sievers
DOI:
10.1364/josaa.18.002998
发表时间:
2001-12-01
影响因子:
1.9
作者:
Bohn, JL;Nesbitt, DJ;Gallagher, A
通讯作者:
Gallagher, A