Configurable topological textures in strain graded ferroelectric nanoplates.

Configurable topological textures in strain graded ferroelectric nanoplates.
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应变级铁电纳米板中的可构型拓扑纹理。

DOI:
10.1038/s41467-017-02813-5
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发表时间:
2018-01-26
影响因子:
16.6
通讯作者:
Yang CH
Yang CH
中科院分区:
综合性期刊1区
文献类型:
--
作者:
Kim KE;Jeong S;Chu K;Lee JH;Kim GY;Xue F;Koo TY;Chen LQ;Choi SY;Ramesh R;Yang CH

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物质中的拓扑缺陷集体行为形成高度非平凡的结构,称为拓扑织构,其特征是守恒量,如圈数。在这里,我们证明了铋铁氧体的外延铁电方形纳米板受到与失配应变弛豫相关的大应变梯度(高达105 m−1)的影响,由于其特殊的径向象限畴织构和固有的畴壁手性,整个系统的铁电拓扑不变性可以达到五个离散水平。通过选择象限域的非局部电开关,拓扑织构的总绕组数可以从−1到3配置。通过角分辨压响应力显微镜结合局部圈数分析,我们直接识别了涡旋和反涡旋的存在,观察了涡旋对的产生和湮灭,并操纵了涡旋的净数。我们的发现为多级拓扑缺陷记忆提供了一个有用的概念。探索铁电体的拓扑结构有助于对物质拓扑特征的理解和应用。本文作者利用角分辨压响应力显微镜展示了应变场诱导的菱形相BiFeO3纳米薄片中拓扑涡的演化。
Topological defects in matter behave collectively to form highly non-trivial structures called topological textures that are characterised by conserved quantities such as the winding number. Here we show that an epitaxial ferroelectric square nanoplate of bismuth ferrite subjected to a large strain gradient (as much as 105 m−1) associated with misfit strain relaxation enables five discrete levels for the ferroelectric topological invariant of the entire system because of its peculiar radial quadrant domain texture and its inherent domain wall chirality. The total winding number of the topological texture can be configured from − 1 to 3 by selective non-local electric switching of the quadrant domains. By using angle-resolved piezoresponse force microscopy in conjunction with local winding number analysis, we directly identify the existence of vortices and anti-vortices, observe pair creation and annihilation and manipulate the net number of vortices. Our findings offer a useful concept for multi-level topological defect memory. Exploring topological textures in ferroelectrics facilitates the understanding and application of topological features in matter. Here the authors demonstrate the strain field induced evolution of topological vortices in nanoplatelets of rhombohedral phase BiFeO3 using the angle-resolved piezoresponse force microscopy.
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