Dehydrogenation-induced crystal defects for significant enhancement of critical current density in polycrystalline H-doped MgB2

Dehydrogenation-induced crystal defects for significant enhancement of critical current density in polycrystalline H-doped MgB2
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脱氢引起的晶体缺陷显着提高了多晶 H 掺杂 MgB2 的临界电流密度

DOI:
10.1007/s10854-020-04862-x
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发表时间:
2020-11
期刊:
Journal of Materials Science: Materials in Electronics
影响因子:
--
通讯作者:
Feng Xinya
Feng Xinya
中科院分区:
其他
文献类型:
--
作者:
Cai Qi;Li Xinyao;Li Shukui;He Chuan;Liu Xingwei;Feng Xinya

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本研究发现硼氢化物的钉扎和氢处理的MgB2块体中的晶体缺陷显著提高了临界电流密度。基于气体掺杂的概念,制备了纳米硼氢化物Mg(BH4)2
The present study discovers the significant enhancement of critical current density by the pinning of borohydride and crystal defects in the hydrogen-treated MgB 2 bulks. Based on the concept of gas doping, the nanosized borohydride Mg(BH 4 ) 2 is formed
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