Investigation of localized Phase Changes using High Resolution Electron Back-Scatter Diffraction in Thin Film Cadmium Telluride Photovoltaic Material with High Lattice Defect Densities
Investigation of localized Phase Changes using High Resolution Electron Back-Scatter Diffraction in Thin Film Cadmium Telluride Photovoltaic Material with High Lattice Defect Densities
复制标题
使用高分辨率电子背散射衍射研究具有高晶格缺陷密度的薄膜碲化镉光伏材料中的局部相变
DOI:
10.1109/pvsc.2018.8547212
复制
发表时间:
2018
期刊:
影响因子:
--
通讯作者:
Abbas A
中科院分区:
文献类型:
--
作者:
Abbas A
DOI:
--
发表时间:
2002
期刊:
2008 33rd IEEE Photovoltaic Specialists Conference
影响因子:
--
作者:
W. Sampath;Sandeep Kohli;R. A. Enzenroth;K. Barth;V. Manivannan;J. Hilfiker;P. Mccurdy;K. Barricklow;P. Noronha
通讯作者:
P. Noronha
DOI:
10.1109/pvsc.2013.6744166
发表时间:
2013
期刊:
2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)
影响因子:
--
作者:
A. Abbas;G. West;J. Bowers;P. Kamiński;B. Maniscalco;J. Walls;W. Sampath;K. Barth
通讯作者:
K. Barth