Investigation of localized Phase Changes using High Resolution Electron Back-Scatter Diffraction in Thin Film Cadmium Telluride Photovoltaic Material with High Lattice Defect Densities

Investigation of localized Phase Changes using High Resolution Electron Back-Scatter Diffraction in Thin Film Cadmium Telluride Photovoltaic Material with High Lattice Defect Densities
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使用高分辨率电子背散射衍射研究具有高晶格缺陷密度的薄膜碲化镉光伏材料中的局部相变

DOI:
10.1109/pvsc.2018.8547212
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发表时间:
2018
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通讯作者:
Abbas A
Abbas A
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Abbas A

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