Measurement of the second-order spectral diffraction efficiency of polarized dual-grating spectrometers
Measurement of the second-order spectral diffraction efficiency of polarized dual-grating spectrometers
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偏振双光栅光谱仪二阶光谱衍射效率的测量
DOI:
10.1016/j.ijleo.2018.11.080
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发表时间:
2019-02
期刊:
影响因子:
3.1
通讯作者:
Zhanfeng Li
中科院分区:
文献类型:
--
作者:
Hanshuang Li;Bo Li;Shurong Wang;Xiaohu Yang;Zhanfeng Li
The diffraction efficiency of dual-grating spectrometers is crucial to the research of spectrometer optical systems, meanwhile it is one of the important indexes for evaluating optical system. The second-order spectral diffraction efficiency of the polarized light has not been thoroughly investigated despite its importance to research on dual-grating spectrometers.However, it affects the imaging quality of the diffractive optical elements, and evaluating of spectrometer optical efficiency. In this work, a test system for the measurement of the second-order spectral diffraction efficiency of polarized light was established. The test system is comprised of a xenon lamp, a collimation system, a polarizer, and a dual-grating spectrometer. The spectral signals of S-and P-polarized light in the band of 285–650 nm were obtained, and the second-order spectral diffraction efficiency measurements of S-and P-polarized light in the band of 285–325 nm were measured. Test results showed that in the 285–325 nm bands, the second-order spectral diffraction efficiency of S-polarized light changed from 30.34% to 4.64%, and that of P-polarized light changed from 3.52% to 0.57%. And the uncertainty of spectrometer system was 2.66%.
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DOI:
10.1117/12.279368
发表时间:
1997-11
期刊:
--
影响因子:
--
作者:
U. Flechsig;F. Eggenstein;R. Follath;F. Senf
通讯作者:
U. Flechsig;F. Eggenstein;R. Follath;F. Senf
影响因子:
1.9
作者:
Jianlin Zhao;Jifeng Li;Hongli Xiang;Jianglei Di
通讯作者:
Jianlin Zhao;Jifeng Li;Hongli Xiang;Jianglei Di
影响因子:
1.9
作者:
W. R. Hunter;Dianne K. Prinz
通讯作者:
W. R. Hunter;Dianne K. Prinz
影响因子:
1.9
作者:
J. B. Breckinridge
通讯作者:
J. B. Breckinridge
影响因子:
3.8
作者:
Yi Qu;Shurong Wang;Zhenduo Zhang;Fu-tian Li
通讯作者:
Yi Qu;Shurong Wang;Zhenduo Zhang;Fu-tian Li