Measurement of the second-order spectral diffraction efficiency of polarized dual-grating spectrometers

Measurement of the second-order spectral diffraction efficiency of polarized dual-grating spectrometers
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偏振双光栅光谱仪二阶光谱衍射效率的测量

DOI:
10.1016/j.ijleo.2018.11.080
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发表时间:
2019-02
期刊:
影响因子:
3.1
通讯作者:
Zhanfeng Li
Zhanfeng Li
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Hanshuang Li;Bo Li;Shurong Wang;Xiaohu Yang;Zhanfeng Li

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双光栅光谱仪的衍射效率是光谱仪光学系统研究的关键,也是评价光学系统的重要指标之一。偏振光的二阶光谱衍射效率在双光栅光谱仪的研究中具有重要意义,但其影响衍射光学元件的成像质量,影响光谱仪光学效率的评价,目前还没有得到深入的研究。本文建立了一套测量偏振光二阶光谱衍射效率的测试系统。测试系统由氙灯、准直系统、起偏器和双光栅光谱仪组成。获得了285-650 nm波段的S偏振光和P偏振光的光谱信号,测量了285-325 nm波段S偏振光和P偏振光的二阶光谱衍射效率。测试结果表明,在285-325 nm波段,S偏振光的二阶光谱衍射效率从30.34%变化到4.64%,P偏振光的二阶光谱衍射效率从3.52%变化到0.57%。光谱仪系统的不确定度为2.66%。
The diffraction efficiency of dual-grating spectrometers is crucial to the research of spectrometer optical systems, meanwhile it is one of the important indexes for evaluating optical system. The second-order spectral diffraction efficiency of the polarized light has not been thoroughly investigated despite its importance to research on dual-grating spectrometers.However, it affects the imaging quality of the diffractive optical elements, and evaluating of spectrometer optical efficiency. In this work, a test system for the measurement of the second-order spectral diffraction efficiency of polarized light was established. The test system is comprised of a xenon lamp, a collimation system, a polarizer, and a dual-grating spectrometer. The spectral signals of S-and P-polarized light in the band of 285–650 nm were obtained, and the second-order spectral diffraction efficiency measurements of S-and P-polarized light in the band of 285–325 nm were measured. Test results showed that in the 285–325 nm bands, the second-order spectral diffraction efficiency of S-polarized light changed from 30.34% to 4.64%, and that of P-polarized light changed from 3.52% to 0.57%. And the uncertainty of spectrometer system was 2.66%.
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