Improved Tangent Space-Based Distance Metric for Lithographic Hotspot Classification

Improved Tangent Space-Based Distance Metric for Lithographic Hotspot Classification
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用于光刻热点分类的改进的基于切线空间的距离度量

DOI:
10.1109/tcad.2016.2638440
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发表时间:
2017-09
影响因子:
2.9
通讯作者:
Zhou Dian
Zhou Dian
中科院分区:
计算机科学3区
文献类型:
--
作者:
Yang Fan;Sinha Subarna;Chiang Charles C.;Zeng Xuan;Zhou Dian

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A distance metric of patterns is crucial to hotspot cluster analysis and classification. In this paper, we propose an improved tangent space (ITS)-based distance metric for hotspot cluster analysis and classification. The proposed distance metric is an important extension of the well-developed tangent space method in computer vision. It can handle patterns containing multiple polygons, while the traditional tangent space method can only deal with patterns with a single polygon. It inherits most of the advantages of the traditional tangent space method, e.g., it is easy to compute and is tolerant with small variations or shifts of the shapes. The ITS-based distance metric is a more reliable and accurate metric for hotspot cluster analysis and classification. We also propose a hierarchical density-based clustering method for hotspot clustering. It is more suitable for arbitrary shaped clusters.
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