How little data is enough? Phase-diagram analysis of sparsity-regularized X-ray computed tomography.

How little data is enough? Phase-diagram analysis of sparsity-regularized X-ray computed tomography.
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DOI:
10.1098/rsta.2014.0387
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发表时间:
2015-06-13
期刊:
Philosophical transactions. Series A, Mathematical, physical, and engineering sciences
影响因子:
--
通讯作者:
Sidky EY
Sidky EY
中科院分区:
其他
文献类型:
--
作者:
Jørgensen JS;Sidky EY

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我们介绍了相图分析,在压缩传感(CS)的标准工具,X射线计算机断层扫描(CT)社区作为一个系统的方法,用于确定如何少的投影足够精确的稀疏正则化重建。在CS中,相图是研究和表达稀疏性和充分采样之间的某些理论关系的方便方法。我们适应相图分析的经验使用在X射线CT相同的理论结果不成立。我们在三个案例研究中展示了相图分析的潜力,为采样不足的问题提供定量的答案。首先,我们证明,有情况下,X射线CT凭经验执行一个接近最佳的CS策略,即采取测量与高斯传感矩阵。第二,我们表明,与预期的相反,与标准结构化采样模式相比,随机CT测量并不能提高性能。最后,我们展示了如何以及相位图分析可以预测足够数量的预测准确地重建一个给定的稀疏性的大规模图像通过总变分正则化的初步结果。
We introduce phase-diagram analysis, a standard tool in compressed sensing (CS), to the X-ray computed tomography (CT) community as a systematic method for determining how few projections suffice for accurate sparsity-regularized reconstruction. In CS, a phase diagram is a convenient way to study and express certain theoretical relations between sparsity and sufficient sampling. We adapt phase-diagram analysis for empirical use in X-ray CT for which the same theoretical results do not hold. We demonstrate in three case studies the potential of phase-diagram analysis for providing quantitative answers to questions of undersampling. First, we demonstrate that there are cases where X-ray CT empirically performs comparably with a near-optimal CS strategy, namely taking measurements with Gaussian sensing matrices. Second, we show that, in contrast to what might have been anticipated, taking randomized CT measurements does not lead to improved performance compared with standard structured sampling patterns. Finally, we show preliminary results of how well phase-diagram analysis can predict the sufficient number of projections for accurately reconstructing a large-scale image of a given sparsity by means of total-variation regularization.
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