Hydrogen microscopy – Distribution of hydrogen in buckled niobium hydrogen thin films

Hydrogen microscopy – Distribution of hydrogen in buckled niobium hydrogen thin films
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氢显微镜 â 屈曲铌氢薄膜中氢的分布

DOI:
10.1016/j.ijhydene.2013.08.006
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发表时间:
2013
影响因子:
7.2
通讯作者:
Günther Dollinger
Günther Dollinger
中科院分区:
工程技术2区
文献类型:
--
作者:
Stefan Wagner;Marcus Moser;Christoph Greubel;Katrin Peeper;Patrick Reichart;Astrid Pundt;Günther Dollinger

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固定在刚性基底上的金属薄膜中的氢吸收会产生机械应力,使氢的化学势改变ΔμH(σ)= −1.124σkJ/molH(σ以[GPa]测量)。在本文中,我们表明,局部应力松弛的铌氢薄膜从衬底上的分离影响的化学势在局部尺度上:使用符合质子-质子散射在质子微探针,氢浓度确定与μm的分辨率,揭示了氢是不均匀分布在膜中。薄膜的局部氢溶解度随其局部应力状态而变化,映射了屈曲薄膜分数。在铌氢薄膜加载到标称浓度在两相共存区,钳位膜分数保持在固溶体相,而氢化物相。将这些结果与考虑应力对化学势的影响的简单模型进行了比较。
Hydrogen absorption in thin metal films clamped to rigid substrates results in mechanical stress that changes the hydrogen's chemical potential by ΔμH(σ) = −1.124σkJ/molHforσmeasured in [GPa]. In this paper we show that local stress relaxation by the detachment of niobium hydrogen thin films from the substrate affects the chemical potential on the local scale: using coincident proton–proton scattering at a proton microprobe, the hydrogen concentration is determined with μm resolution, revealing that hydrogen is not homogenously distributed in the film. The local hydrogen solubility of the film changes with its local stress state, mapping the buckled film fraction. In niobium hydrogen thin films loaded up to nominal concentrations in the two-phase coexistence region, the clamped film fraction remains in the solid solution phase, while the buckles represent the hydride phase. These results are compared to a simple model taking the stress impact on the chemical potential into account.
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