The role of convolutional neural networks in scanning probe microscopy: a review.

The role of convolutional neural networks in scanning probe microscopy: a review.
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DOI:
10.3762/bjnano.12.66
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发表时间:
2021
影响因子:
3.1
通讯作者:
Cohen SR
Cohen SR
中科院分区:
材料科学3区
文献类型:
--
作者:
Azuri I;Rosenhek-Goldian I;Regev-Rudzki N;Fantner G;Cohen SR

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计算能力的进步在许多方面加强了科学。近年来,机器学习的各个分支一直是开拓新途径的关键促进者,从大数据分类到仪器控制,从材料设计到图像分析。深度学习具有识别嵌入数据集中的抽象特征的能力,随后使用这种关联来分类、识别和隔离数据的子集。扫描探针显微镜测量多模式表面属性,将形态与电子、机械和其他特征相结合。在这篇综述中,我们重点介绍了深度学习算法的一个子集,即卷积神经网络,以及它是如何改变扫描探针数据的采集和分析的。
Progress in computing capabilities has enhanced science in many ways. In recent years, various branches of machine learning have been the key facilitators in forging new paths, ranging from categorizing big data to instrumental control, from materials design through image analysis. Deep learning has the ability to identify abstract characteristics embedded within a data set, subsequently using that association to categorize, identify, and isolate subsets of the data. Scanning probe microscopy measures multimodal surface properties, combining morphology with electronic, mechanical, and other characteristics. In this review, we focus on a subset of deep learning algorithms, that is, convolutional neural networks, and how it is transforming the acquisition and analysis of scanning probe data.
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