Sub-nanometre resolution imaging of polymer-fullerene photovoltaic blends using energy-filtered scanning electron microscopy.
Sub-nanometre resolution imaging of polymer-fullerene photovoltaic blends using energy-filtered scanning electron microscopy.
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DOI：
10.1038/ncomms7928
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发表时间：
2015-04-24
影响因子：
16.6
通讯作者：
Rodenburg, Cornelia
中科院分区：
文献类型：
--
作者：
Masters, Robert C.;Pearson, Andrew J.;Glen, Tom S.;Sasam, Fabian-Cyril;Li, Letian;Dapor, Maurizio;Donald, Athene M.;Lidzey, David G.;Rodenburg, Cornelia
近年来，扫描电子显微镜的分辨率有了很大的提高，现在至少在亚纳米范围内，对于无机材料。在纳米结构有机材料（如有机光伏共混物）的形貌成像方面，还没有取得类似的进展。在这里，我们展示了能量选择性二次电子检测可以用来获得高对比度，材料特定的有机光伏混合图像。我们还发现，在我们的数据中，我们可以区分混合相和纯物质相。横向分辨率是以前报道的二次电子成像的两倍。我们的研究结果表明，我们的能量过滤扫描电子显微镜方法将能够在理解复杂的纳米结构有机材料方面取得重大进展。由于缺乏精确的化学作图工具，限制了有机光伏活性层的形态表征。在这里，作者展示了一种能量过滤扫描电子显微镜技术，该技术可以对有机光伏混合物进行亚纳米分辨率成像。
The resolution capability of the scanning electron microscope has increased immensely in recent years, and is now within the sub-nanometre range, at least for inorganic materials. An equivalent advance has not yet been achieved for imaging the morphologies of nanostructured organic materials, such as organic photovoltaic blends. Here we show that energy-selective secondary electron detection can be used to obtain high-contrast, material-specific images of an organic photovoltaic blend. We also find that we can differentiate mixed phases from pure material phases in our data. The lateral resolution demonstrated is twice that previously reported from secondary electron imaging. Our results suggest that our energy-filtered scanning electron microscopy approach will be able to make major inroads into the understanding of complex, nano-structured organic materials. Morphological characterization of organic photovoltaic active layers is restricted by the lack of accurate chemical mapping tools. Here, the authors demonstrate an energy-filtered scanning electron microscopy technique, which enables sub-nanometre resolution imaging of an organic photovoltaic blend.
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影响因子：
2
作者：
Joy, DC
通讯作者：
Joy, DC
影响因子：
2.2
作者：
Kazemian, P.;Mentink, S. A. M.;Humphreys, C. J.
通讯作者：
Humphreys, C. J.
影响因子：
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作者：
Kesava, Sameer Vajjala;Fei, Zhuping;Gomez, Enrique D.
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Gomez, Enrique D.
影响因子：
8.6
作者：
Kiel, Jonathon W.;Eberle, Aaron P. R.;Mackay, Michael E.
通讯作者：
Mackay, Michael E.
影响因子：
16.6
作者：
Hedley, Gordon J.;Ward, Alexander J.;Alekseev, Alexander;Howells, Calvyn T.;Martins, Emiliano R.;Serrano, Luis A.;Cooke, Graeme;Ruseckas, Arvydas;Samuel, Ifor D. W.
通讯作者：
Samuel, Ifor D. W.