Exact Logic and Fault Simulation in Presence of Unknowns
Exact Logic and Fault Simulation in Presence of Unknowns
复制标题
存在未知数时的精确逻辑和故障模拟
DOI:
10.1145/2611760
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发表时间:
--
期刊:
影响因子:
--
通讯作者:
Becker
中科院分区:
文献类型:
--
作者:
Kochte;Hillebrecht;Schubert;Wunderlich;Becker
Logic and fault simulation are essential techniques in electronic design automation. The accuracy of standard simulation algorithms is compromised by unknown or X-values. This results in a pessimistic overestimation of X-valued signals in the circuit and a pessimistic underestimation of fault coverage.This work proposes efficient algorithms for combinational and sequential logic as well as for stuck-at and transition-delay fault simulation that are free of any simulation pessimism in presence of unknowns. The SAT-based algorithms exactly classifiy all signal states. During fault simulation, each fault is accurately classified as either undetected, definitely detected, or possibly detected.The pessimism with respect to unknowns present in classic algorithms is thoroughly investigated in the experimental results on benchmark circuits. The applicability of the proposed algorithms is demonstrated on larger industrial circuits. The results show that, by accurate analysis, the number of detected faults can be significantly increased without increasing the test-set size.
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DOI:
--
发表时间:
1989
期刊:
1989 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers
影响因子:
--
作者:
J. L. Carter;B. Rosen;Gordon L. Smith;V. Pitchumani
通讯作者:
V. Pitchumani
DOI:
--
发表时间:
1999
期刊:
Journal of electronic testing
影响因子:
--
作者:
B. Becker;Martin Keim;Rolf Krieger
通讯作者:
Rolf Krieger
DOI:
--
发表时间:
1996
期刊:
Proceedings International Test Conference 1996. Test and Design Validity
影响因子:
--
作者:
E. Rudnick;J. Patel;I. Pomeranz
通讯作者:
I. Pomeranz
DOI:
10.1007/3-540-40922-x_29
发表时间:
2000
期刊:
2015 IEEE 16th International Symposium on High Assurance Systems Engineering
影响因子:
--
作者:
Chris Wilson;D. Dill;R. Bryant
通讯作者:
R. Bryant
DOI:
--
发表时间:
2012
期刊:
IEEE European Test Symposium
影响因子:
--
作者:
Stefan Hillebrecht;M. Kochte;H. Wunderlich;B. Becker
通讯作者:
B. Becker