A novel approach for automatic common-centroid pattern generation

A novel approach for automatic common-centroid pattern generation
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一种自动生成共质心模式的新方法

DOI:
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发表时间:
2017
期刊:
International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design
影响因子:
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通讯作者:
Benjamin Prautsch
Benjamin Prautsch
中科院分区:
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文献类型:
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作者:
V. Borisov;Kerstin Langner;J. Scheible;Benjamin Prautsch

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本文介绍了一种新的共质心(CC)图形发生器的放置方法。它可以应用于各种集成电路(IC)元件,如晶体管、电容器、二极管和电阻。该方法由生成初始逼近最优解的构造算法和在构造算法输出不满足期望条件时使用的迭代算法组成。这项工作的结果是一个自动CC放置算法的集成电路元件阵列。此外,本文还提出了一种CC布置评价方法。它允许评估数组的质量,并比较不同的放置方法。
This paper introduces a novel placement methodology for a common-centroid (CC) pattern generator. It can be applied to various integrated circuit (IC) elements, such as transistors, capacitors, diodes, and resistors. The proposed method consists of a constructive algorithm which generates an initial, close to the optimum, solution, and an iterative algorithm which is used subsequently, if the output of constructive algorithm does not satisfy the desired criteria. The outcome of this work is an automatic CC placement algorithm for IC element arrays. Additionally, the paper presents a method for the CC arrangement evaluation. It allows for evaluating the quality of an array, and a comparison of different placement methods.
DOI: --
发表时间: 2000-12
期刊: --
影响因子: --
作者:
A. Hastings
通讯作者: A. Hastings