First-principle study of the microstructure and electronic properties for Cr3+ doped yttrium orthoaluminate
First-principle study of the microstructure and electronic properties for Cr3+ doped yttrium orthoaluminate
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Cr3掺杂原铝酸钇微结构和电子性能的第一性原理研究
DOI:
10.1016/j.commatsci.2019.109467
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发表时间:
2020-03
影响因子:
3.3
通讯作者:
Ju Meng
中科院分区:
文献类型:
--
作者:
Huang Jing;Ju Meng
Chromium ion (Cr3+) doped YAlO3host crystal shows strong prospects for the exploitation of new optical materials. However, the microstructure of Cr3+doped of YAlO3is still unclear. In this work, we systematically explore the structural evolutions of Cr3+doped of YAlO3system by using the CALYPSO method and density functional theory. A novel cage-like structure withP-1 space group is identified for the first time. The impurity Cr3+ion can naturally substitute the Al3+ion of the central site in the crystal lattice. The result show that the impurity Cr3+concentration is determined to be 6.25%, which is almost comparable to the experiments. The perfect agreement between our simulated X-ray diffraction patterns and the measured ones demonstrates the validity of the ground-state structure. The calculation of electronic band structure for Cr3+doped YAlO3reveals a closure of the insulator band gap, forming an energy gap of 2.94 eV. The result of electronic density of states shows that it is the impurity Cr3+ion that leads to a transition from insulator to semiconductor. By analyzing the electron localization function of Cr3+doped of YAlO3crystal, we conclude that the Cr–O interaction is dominantly ionic bond. The obtained results could provide an important understanding of the transition-metal doped host materials.
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影响因子:
6.3
作者:
Wang, Yanchao;Lv, Jian;Ma, Yanming
通讯作者:
Ma, Yanming
影响因子:
3.9
作者:
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影响因子:
3.6
作者:
Z. Wen-chen;Li Bang-Xing;Feng Guoying;Liu Hong-gang
通讯作者:
Z. Wen-chen;Li Bang-Xing;Feng Guoying;Liu Hong-gang
影响因子:
3.9
作者:
S. Feofilov;A. Kulinkin
通讯作者:
S. Feofilov;A. Kulinkin
影响因子:
1.6
作者:
H. Uchiyama;H. Aizawa;T. Katsumata;S. Komuro;T. Morikawa;E. Toba
通讯作者:
H. Uchiyama;H. Aizawa;T. Katsumata;S. Komuro;T. Morikawa;E. Toba