Heck coupling of olefins to mixed methyl/thienyl monolayers on Si(111) surfaces.
Heck coupling of olefins to mixed methyl/thienyl monolayers on Si(111) surfaces.
复制标题
烯烃与 Si(111) 表面上的混合甲基/噻吩单分子层的 Heck 耦合。
DOI:
10.1021/ja402495e
复制
发表时间:
2013
影响因子:
15
通讯作者:
N. Lewis
中科院分区:
文献类型:
--
作者:
Leslie E. O'Leary;Michael J. Rose;Tina X. Ding;E. Johansson;B. Brunschwig;N. Lewis
The Heck reaction has been used to couple olefins to a Si(111) surface that was functionalized with a mixed monolayer comprised of methyl and thienyl groups. The coupling method maintained a conjugated linkage between the surface and the olefinic surface functionality, to allow for facile charge transfer from the silicon surface. While a Si(111) surface terminated only with thienyl groups displayed a surface recombination velocity, S, of 670 ± 190 cm s(-1), the mixed CH3/SC4H3-Si(111) surfaces with a coverage of θSC4H3 = 0.15 ± 0.02 displayed a substantially lower value of S = 27 ± 9 cm s(-1). Accordingly, CH3/SC4H3-Si(111) surfaces were brominated with N-bromosuccinimide, to produce mixed CH3/SC4H2Br-Si(111) surfaces with coverages of θBr-Si < 0.05. The resulting aryl halide surfaces were activated using [Pd(PPh3)4] as a catalyst. After activation, Pd(II) was selectively coordinated by oxidative addition to the surface-bound aryl halide. The olefinic substrates 4-fluorostyrene, vinylferrocene, and protoporphyrin IX dimethyl ester were then coupled (in dimethylformamide at 100 °C) to the Pd-containing functionalized Si surfaces. The porphyrin-modified surface was then metalated with Co, Cu, or Zn. The vinylferrocene-modified Si(111) surface showed a linear dependence of the peak current on scan rate in cyclic voltammetry, indicating that facile electron transfer had been maintained and providing evidence of a robust linkage between the Si surface and the tethered ferrocene. The final Heck-coupled surface exhibited S = 70 cm s(-1), indicating that high-quality surfaces could be produced by this multistep synthetic approach for tethering small molecules to silicon photoelectrodes.
影响因子:
56.9
作者:
Lin, VSY;Motesharei, K;Ghadiri, MR
通讯作者:
Ghadiri, MR
影响因子:
5.2
作者:
Stewart, Ian C.;Douglas, Christopher J.;Grubbs, Robert H.
通讯作者:
Grubbs, Robert H.
影响因子:
15
作者:
Stewart, Ian C.;Keitz, Benjamin K.;Kuhn, Kevin M.;Thomas, Renee M.;Grubbs, Robert H.
通讯作者:
Grubbs, Robert H.