Quantitative hydrogen state analysis in the leached layer of soda-lime-silica glass by combination of nuclear reaction analysis and C60-X-ray photoelectron spectroscopy

Quantitative hydrogen state analysis in the leached layer of soda-lime-silica glass by combination of nuclear reaction analysis and C60-X-ray photoelectron spectroscopy
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核反应分析与C60-X射线光电子能谱相结合定量分析钠钙硅玻璃浸出层中的氢态

DOI:
10.1016/j.jnoncrysol.2021.121160
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发表时间:
2021
影响因子:
3.5
通讯作者:
Fukutani Katsuyuki
Fukutani Katsuyuki
中科院分区:
材料科学2区
文献类型:
--
作者:
Suehara Michinori;Yamamoto Yuichi;Ogura Shohei;Fukutani Katsuyuki

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采用核反应分析(NRA)和深度分辨c60 - x射线光电子能谱(XPS)研究了酸处理对钠-石灰-硅玻璃表层的影响。随着HCl处理时间的延长,H的数量增加,分布在深度约为150nm的区域。然而,在近表面区域,15n2 +束辐照对NRA的损伤是巨大的,信号强度随着离子剂量的增加而快速衰减。用C60-XPS检测了表层钠、镁、钙的损耗。酸处理在150nm深度下消耗钠,但镁和钙的消耗发生在大约30nm深度内。假设碱土元素和碱土元素与h30 +发生离子交换反应,通过钠、镁、钙的损耗谱来评价Si-OH浓度谱。根据NRA得到的Si-OH剖面与H分布的差异,估算出浸出层的H2O/Si-OH比值为1.3。
The effects of acid treatment on the surface layer of soda-lime-silica glasses were investigated by nuclear reaction analysis (NRA) and C60-X-ray photoelectron spectroscopy (XPS) in a depth-resolved manner. As the time of treatment with HCl increased, the amount of H increased and was distributed in a region at a depth of almost 150 nm. In the near-surface region, however, the damage due to15N2+beam irradiation for conducting the NRA was found to be substantial as observed by the fast decay of signal intensity with increasing ion dose. The depletion of sodium, magnesium, and calcium in the surface layer was examined by C60-XPS. Sodium was depleted at a depth of 150 nm by the acid treatment, but the depletion of magnesium and calcium occurred at a depth within approximately 30 nm. Assuming the ion exchange reaction between the alkaline and alkaline earth elements with H3O+, the Si-OH concentration profile was evaluated from the depletion profiles of sodium, magnesium, and calcium. From the difference between the Si-OH profile and H distribution obtained by NRA, the H2O/Si-OH ratio in the leached layer was estimated at 1.3.
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