Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage

Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage
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总电离剂量辐射损伤引起的 COTS 线性 CCD 退化评估

DOI：
10.1155/2016/9604042
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发表时间：
2016-07
期刊：
Journal of Sensors
影响因子：
1.9
通讯作者：
Sheng, Jiangkun
Sheng, Jiangkun
中科院分区：
工程技术4区
文献类型：
--
作者：
Yao, Zhibin;Huang, Shaoyan;Liu, Minbo;Sheng, Jiangkun

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The evaluation of the degradation on a COTS linear Charge Coupled Device (CCD) induced by total ionizing dose (TID) radiation damage was presented. The radiation experiments were carried out at a 60Co γ-ray source. The parameters of DALSA’s linear CCD wer
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