Structured illumination microscopy with noise-controlled image reconstructions.
Structured illumination microscopy with noise-controlled image reconstructions.
复制标题
具有噪声控制图像重建的结构照明显微镜。
DOI:
10.1038/s41592-021-01167-7
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发表时间:
2021-07
期刊:
影响因子:
48
通讯作者:
Stallinga S
中科院分区:
文献类型:
--
作者:
Smith CS;Slotman JA;Schermelleh L;Chakrova N;Hari S;Vos Y;Hagen CW;Müller M;van Cappellen W;Houtsmuller AB;Hoogenboom JP;Stallinga S
Super-resolution structured illumination microscopy (SIM) has become a widely used method for biological imaging. Standard reconstruction algorithms, however, are prone to generate noise-specific artefacts that limit their applicability for lower signal-to-noise data. Here, we present a physically realistic noise model that explains the structured noise artefact and that is used to motivate new complementary reconstruction approaches. True Wiener-filtered SIM optimizes contrast given the available signal-to-noise ratio, flat-noise SIM fully overcomes the structured noise artefact while maintaining resolving power. Both methods eliminate ad-hoc user adjustable reconstruction parameters in favour of physical parameters, enhancing objectivity. The new reconstructions point to a trade-off between contrast and a natural noise appearance. This trade-off can be partly overcome by additional notch filtering, but at the expense of a decrease in signal-to-noise ratio. The benefits of the proposed approaches are demonstrated on focal adhesion and tubulin samples in 2D and 3D, and on nano-fabricated fluorescent test patterns.
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DOI:
10.1002/cphc.201300831
发表时间:
2014-03-17
期刊:
Chemphyschem : a European journal of chemical physics and physical chemistry
影响因子:
--
作者:
Ingaramo M;York AG;Hoogendoorn E;Postma M;Shroff H;Patterson GH
通讯作者:
Patterson GH
影响因子:
16.6
作者:
Jin, Luhong;Liu, Bei;Hahn, Klaus M.
通讯作者:
Hahn, Klaus M.
影响因子:
16.6
作者:
Markwirth, Andreas;Lachetta, Mario;Mueller, Marcel
通讯作者:
Mueller, Marcel
影响因子:
1.9
作者:
FRIED, DL
通讯作者:
FRIED, DL
影响因子:
16.6
作者:
Müller M;Mönkemöller V;Hennig S;Hübner W;Huser T
通讯作者:
Huser T