Design of Accurate Low-Cost On-Chip Structures for Protecting Integrated Circuits Against Recycling

The recycling of electronic components has become a major industrial and governmental concern, as it could potentially impact the security and reliability of a wide variety of electronic systems. It is extremely challenging to detect a recycled integrated circuit (IC) that is already used for a very short period of time because the process variations outpace the degradation caused by aging, especially in lower technology nodes. In this paper, we propose a suite of solutions, based on lightweight negative bias temperature instability (NBTI)-aware ring oscillators (ROs), for combating die and IC recycling (CDIR) when ICs are used for a very short duration. The proposed solutions are implemented in the 90-nm technology node. The simulation results demonstrate that our newly proposed NBTI-aware multiple pair RO-based CDIRs can detect ICs used only for a few hours.

电子组件的回收已成为一个主要的工业和政府关注，因为它可能会影响各种电子系统的安全性和可靠性。检测回收的集成电路（IC）非常具有挑战性，该电路（IC）已经在很短的时间内使用，因为过程变化超过了衰老引起的降解，尤其是在低技术节点中。在本文中，我们提出了一套解决方案，基于轻质负偏置温度不稳定性（NBTI） - 意识环振荡器（ROS），用于对抗DIE和IC回收（CDIR），当时ICS持续时间很短。提出的解决方案在90 nm技术节点中实现。仿真结果表明，我们新提出的NBTi感知多对基于RO的CDIR可以检测到仅使用几个小时的IC。