A novel self-activated ultraviolet persistent luminescence material and its anti-counterfeiting application based on intensity and time resolution from persistent luminescence
A novel self-activated ultraviolet persistent luminescence material and its anti-counterfeiting application based on intensity and time resolution from persistent luminescence
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一种新型自激活紫外余辉发光材料及其基于余辉强度和时间分辨率的防伪应用
DOI:
10.1016/j.jre.2022.01.005
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发表时间:
2022-01
影响因子:
4.9
通讯作者:
Yun Zhang
中科院分区:
文献类型:
--
作者:
Shanshan Peng;Lin Liu;Liu Chun Wang;Rui Rong;Liang Song;Weixiong You;Junpeng Shi;Yun Zhang
Recently, the ultraviolet (UV) persistent luminescence material (PLM) has attracted extensive attention. However, the design and development of new UV PLM and exploring their promising advanced application remain challenges. Here, we developed a new dopant-free self-activated UVA PLM, Zn 2 Al 2 SiO 7 , which could be applied in anti-counterfeiting field. Zn 2 Al 2 SiO 7 shows UVA persistent luminescence (PersL) peaking at 380 nm after 254 nm UV lamp excitation. Addition of Yb 3+ , the UVA PersL intensity and time are raised obviously, and the UVA PersL time lasts more than 24 h. In addition, Yb 3+ -doped Zn 2 Al 2 SiO 7 exhibits photostimulated properties with different light source. Finally, we design anti-counterfeiting pattern based on intensity and time resolution from PersL of Zn 2 Al 2 SiO 7 , showing its advantages in the anti-counterfeiting field. We report a novel self-activated ultraviolet persistent luminescence material Zn 2 Al 2 SiO 7 . Its PersL lasts more than 24 h by addition of Yb 3+ . An anti-counterfeiting pattern based on intensity and time resolution from PersL of Zn 2 Al 2 SiO 7 and Zn 2 Al 2 SiO 7 :Yb 3+ shows its advantage in the anti-counterfeiting field.
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影响因子:
4.9
作者:
Wu Meihua-;C. Wen;Siyuan Liu;Yichao Sun;Ling Huang;G. Chen;Zishan Zheng
通讯作者:
Wu Meihua-;C. Wen;Siyuan Liu;Yichao Sun;Ling Huang;G. Chen;Zishan Zheng
影响因子:
7
作者:
Yi Zhang;Dongxun Chen;Weili Wang;Shao Yan;Jingwei Liu;Yanjie Liang
通讯作者:
Yanjie Liang
DOI:
10.3390/ma6072789
发表时间:
2013-07-12
期刊:
Materials (Basel, Switzerland)
影响因子:
--
作者:
Van den Eeckhout K;Poelman D;Smet PF
通讯作者:
Smet PF
影响因子:
9
作者:
Youfusheng Wu;Wei Wu
通讯作者:
Youfusheng Wu;Wei Wu
影响因子:
9
作者:
Li, Hong;Liu, Qi;Sun, Hong-Tao
通讯作者:
Sun, Hong-Tao