Trace Elemental Analysis of Titanium Dioxide Pigments and Automotive White Paint Fragments for Forensic Examination Using High‐Energy Synchrotron Radiation X‐Ray Fluorescence Spectrometry *

Trace Elemental Analysis of Titanium Dioxide Pigments and Automotive White Paint Fragments for Forensic Examination Using High‐Energy Synchrotron Radiation X‐Ray Fluorescence Spectrometry *
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使用高能同步辐射 X 射线荧光光谱法对二氧化钛颜料和汽车白色油漆碎片进行痕量元素分析,用于法医检验 *

DOI:
10.1111/j.1556-4029.2009.01005.x
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发表时间:
2009
影响因子:
1.6
通讯作者:
I. Nakai
I. Nakai
中科院分区:
医学4区
文献类型:
--
作者:
Y. Nishiwaki;Seiya Watanabe;O. Shimoda;Yasuhiro Saito;Toshio Nakanishi;Y. Terada;T. Ninomiya;I. Nakai

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摘要:  利用 116keV X 射线的高能同步辐射 X 射线荧光光谱法 (SR-XRF) 用于表征二氧化钛颜料(金红石)和汽车白色油漆碎片,以进行法医检查。该技术可以分析 18 种二氧化钛颜料(金红石)中的 9 种微量元素以及 7 种汽车白色油漆碎片的面漆层中的 10 种微量元素的 K 线。研究发现高场强元素(HFSE)强烈反映了二氧化钛(TiO2)颜料的来源,可以作为颜料和油漆碎片的区分和分类的有效参数。对七个汽车白色油漆碎片的面漆层进行了成对比较。高能 SR-XRF 检测到的面漆层中的微量元素对于识别特别有效。通过引入底漆层和电泳漆层的微量元素信息,该技术可以区分所有汽车白漆碎片。
Abstract:  High‐energy synchrotron radiation x‐ray fluorescence spectrometry (SR‐XRF) utilizing 116 keV x‐rays was used to characterize titanium dioxide pigments (rutile) and automotive white paint fragments for forensic examination. The technique allowed analysis of K lines of 9 trace elements in 18 titanium dioxide pigments (rutile), and 10 trace elements in finish coat layers of seven automotive white paint fragments. High‐field strength elements (HFSE) were found to strongly reflect the origin of the titanium dioxide (TiO2) pigments, and could be used as effective parameters for discrimination and classification of the pigments and paint fragments. A pairwise comparison of the finish coat layers of seven automotive white paint fragments was performed. The trace elements in the finish coat layers detected by the high‐energy SR‐XRF were especially effective for identification. By introducing the trace element information of primer and electrocoat layers, all the automotive white paint fragments could be discriminated by this technique.
DOI: 10.1002/0470020431
发表时间: 2004-06
期刊: --
影响因子: --
作者:
K. Tsuji;J. Injuk;R. Grieken
通讯作者: K. Tsuji;J. Injuk;R. Grieken