Deep learning-based synapse counting and synaptic ultrastructure analysis of electron microscopy images
Deep learning-based synapse counting and synaptic ultrastructure analysis of electron microscopy images
复制标题
基于深度学习的电子显微镜图像突触计数和突触超微结构分析
DOI:
10.1016/j.jneumeth.2022.109750
复制
发表时间:
2022-11
期刊:
影响因子:
--
通讯作者:
Chen Zhang
中科院分区:
文献类型:
--
作者:
Feng Su;Mengping Wei;Meng Sun;Lixin Jiang;Zhaoqi Dong;Jue Wang;Chen Zhang
BackgroundSynapses are the connections between neurons in the central nervous system (CNS) or between neurons and other excitable cells in the peripheral nervous system (PNS), where electrical or chemical signals rapidly travel through one cell to another with high spatial precision. Synaptic analysis, based on synapse numbers and fine morphology, is the basis for understanding neurological functions and diseases. Manual analysis of synaptic structures in electron microscopy (EM) images is often limited by low efficiency and subjective bias.New methodWe developed a multifunctional synaptic analysis system based on several advanced deep learning (DL) models. The system achieved synapse counting in low-magnification EM images and synaptic ultrastructure analysis in high-magnification EM images.ResultsThe synapse counting system based on ResNet18 and a Faster R-CNN model had a mean average precision (mAP) of 92.55%. For synaptic ultrastructure analysis, the Faster R-CNN model based on ResNet50 achieved a mAP of 91.60%, the DeepLab v3 + model based on ResNet50 enabled high performance in presynaptic and postsynaptic membrane segmentation with a global accuracy of 0.9811, and the Faster R-CNN model based on ResNet18 achieved a mAP of 91.41% for synaptic vesicle detection.ConclusionsThe proposed multifunctional synaptic analysis system may help to overcome the experimental bias inherent in manual analysis, thereby facilitating EM image–based synaptic function studies.
登录
查看更多内容
影响因子:
2.8
作者:
通讯作者:
--
影响因子:
4.8
作者:
通讯作者:
--
影响因子:
3.7
作者:
通讯作者:
--
影响因子:
9.5
作者:
通讯作者:
--
影响因子:
4.8
作者:
通讯作者:
--