In situ transmission electron microscope studies on one-dimensional nanomaterials: Manipulation, properties and applications
In situ transmission electron microscope studies on one-dimensional nanomaterials: Manipulation, properties and applications
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一维纳米材料的原位透射电子显微镜研究：操作、性能和应用
DOI：
10.1016/j.pmatsci.2020.100674
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发表时间：
2020-08
影响因子：
37.4
通讯作者：
Hu Junqing
中科院分区：
文献类型：
--
作者：
Peng Yuxuan;Zou Rujia;Xu Chaoting;Liu Qian;Ruan Shuangchen;Hu Junqing
The in situ manipulation and property investigation of individual one-dimensional (1-D) nanomaterials (such as nanowires, nanotubes and 1-D heterostructures) as well as the construction of nanodevices based on these nanomaterials that have potential vital applications have become the focus of researchers worldwide. In recent years, the studies on these nanostructures have mainly shifted to three aspects of in-situ manipulation, property investigation and application exploration. The high-resolution transmission electron microscope (HRTEM) equipped with an atomic force microscope (AFM) or a scanning tunneling microscope (STM) holder, and a heating/cooling holder has already developed as the most advanced technology capable of implementing in situ manipulation on and probing physical properties of nano-objects. In this review, we will summarize the significant developments in regards to the on-demand manipulation, thermal, mechanical, and electrical property investigations of 1-D nanomaterials as well as exploring their applications in piezoelectrical devices, lithium ion batteries and field emission devices. The highlight here is that inside a transmission electron microscope (TEM), the thermal, mechanical and electrical transport data are acquired in real time with three-dimensional (3-D) manipulation on one particular nano-object and can thus reflect the dynamic morphological, structural and chemical changes of a given nanomaterial.
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DOI：
10.1109/vlsid.2006.57
发表时间：
2006-01
期刊：
19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06)
影响因子：
--
作者：
A. Javey;H. Dai
通讯作者：
A. Javey;H. Dai
单根 Fe3C 填充碳纳米管的电学和场发射性能的原位 TEM 研究
影响因子：
3.7
作者：
Su, Qingmei;Li, Jie;Du, Gaohui;Xu, Bingshe
通讯作者：
Xu, Bingshe
影响因子：
8.6
作者：
Terrones, M;Banhart, F;Ajayan, PM
通讯作者：
Ajayan, PM
影响因子：
10.8
作者：
Gu, Meng;Parent, Lucas R.;Wang, Chong-Min
通讯作者：
Wang, Chong-Min
影响因子：
10.8
作者：
Koh AL;Gidcumb E;Zhou O;Sinclair R
通讯作者：
Sinclair R