Atomically precise graphene etch stops for three dimensional integrated systems from two dimensional material heterostructures.
Atomically precise graphene etch stops for three dimensional integrated systems from two dimensional material heterostructures.
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原子上精确的石墨烯蚀刻可以从二维材料异质结构的三维集成系统中停止。
DOI:
10.1038/s41467-018-06524-3
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发表时间:
2018-09-28
影响因子:
16.6
通讯作者:
M van der Zande A
中科院分区:
文献类型:
--
作者:
Son J;Kwon J;Kim S;Lv Y;Yu J;Lee JY;Ryu H;Watanabe K;Taniguchi T;Garrido-Menacho R;Mason N;Ertekin E;Huang PY;Lee GH;M van der Zande A
Atomically precise fabrication methods are critical for the development of next-generation technologies. For example, in nanoelectronics based on van der Waals heterostructures, where two-dimensional materials are stacked to form devices with nanometer thicknesses, a major challenge is patterning with atomic precision and individually addressing each molecular layer. Here we demonstrate an atomically thin graphene etch stop for patterning van der Waals heterostructures through the selective etch of two-dimensional materials with xenon difluoride gas. Graphene etch stops enable one-step patterning of sophisticated devices from heterostructures by accessing buried layers and forming one-dimensional contacts. Graphene transistors with fluorinated graphene contacts show a room temperature mobility of 40,000 cm2 V−1 s−1 at carrier density of 4 × 1012 cm−2 and contact resistivity of 80 Ω·μm. We demonstrate the versatility of graphene etch stops with three-dimensionally integrated nanoelectronics with multiple active layers and nanoelectromechanical devices with performance comparable to the state-of-the-art. Fabrication methods to pattern thin materials are a critical tool to build molecular scale devices. Here the authors report a selective etching method using XeF2 gas to pattern graphene based heterostructures with multiple active layers and achieve 1D contacts with low contact resistivity of 80 Ω·µm
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