Femtosecond laser-induced crystallization of amorphous N-doped Ge8Sb92 films and in situ characterization by coherent phonon spectroscopy
Femtosecond laser-induced crystallization of amorphous N-doped Ge8Sb92 films and in situ characterization by coherent phonon spectroscopy
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非晶 N 掺杂 Ge8Sb92 薄膜飞秒激光诱导结晶及相干声子光谱原位表征
DOI:
10.1063/1.4916726
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发表时间:
2015-04
期刊:
影响因子:
--
通讯作者:
Tianshu Lai
中科院分区:
文献类型:
--
作者:
Zhongyu Li;Yifeng Hu;Tianshu Lai
Femtosecond laser-irradiation-induced phase change of amorphous N-doped Ge8Sb92 films is in situ studied by coherent phonon spectroscopy. We have observed that a new coherent optical phonon (COP) mode occurs as laser irradiation fluence reaches certain thresholds, indicating laser-induced phase changes. Additionally, this new phonon mode has also been verified in heat-annealing-crystallized N-doped Ge8Sb92 films, confirming the emergence of laser-irradiation-induced crystallization. By measuring the pump fluence dependence of COP dynamics in laser-crystallized N-doped Ge8Sb92 films, we found that the frequency and lifetime of COP decrease with the increasing of pump fluence, which suggests good crystallinity in laser-crystallized N-doped Ge8Sb92 films. It has also been observed that the crystallization temperature of amorphous N-doped Ge8Sb92 films increases with N-doping content. Our results indicate promising applications of N-doped Ge8Sb92 films in optical phase-change memory devices.
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