Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation
Calibration of crystal orientation and pattern center of EBSD using integrated digital image correlation
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使用集成数字图像相关性校准 EBSD 的晶体取向和图案中心
DOI：
10.1016/j.matchar.2021.111206
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发表时间：
2021-08
影响因子：
4.7
通讯作者：
S. Roux
中科院分区：
文献类型：
--
作者：
Q. Shi;D. Loisnard;C. Dan;F. Zhang;H. Zhong;H. Li;Y. Li;Z. Chen;H. Wang;S. Roux
电子背散射衍射谱图中心的确定一直是制约其测量精度的主要因素，人们提出了许多硬件和软件方法来提高其测量精度。在这里，集成数字图像相关（IDIC）的过程中，提出了同时确定晶体取向和图案中心，通过注册实验和模拟电子衍射图案。为了评估该程序的性能和鲁棒性，报告了许多案例研究。噪声敏感性首先探讨虚拟数据，以评估收敛条件和结果的不确定性高噪声水平和小检测器的大小。两个实验数据集进一步利用。首先，一个高清晰度的探测器显示，晶体取向的不确定度可以达到3×10− 2度，这比商业上基于Hough变换的不确定度方法至少低80%。对不同的样品倾斜角进行了测试，IDIC方法比普通EBSD方法更能容忍不精确的倾斜角。其次，分析了在原位拉伸试验期间进行的具有粗略定义的快速EBSD采集。残余噪声的量化允许人们用适当的逐像素权重来制定优化的IDIC泛函。与后者的改进一个两遍的程序导致晶体取向的测定的精度大大提高，获得更精确的评价地图的几何必要的位错密度。
The accuracy of electron backscatter diffraction indexation has long been limited by pattern center determination, and numerous hardware and software methods have been proposed to improve the calibration. Here, anIntegratedDigital Image Correlation (IDIC) procedure is proposed to determine simultaneously crystal orientation and pattern center by registering experimental and simulated electron diffraction patterns. To assess the performance and robustness of the procedure, numerous case studies are reported. Noise sensitivity is first explored on virtual data to assess convergence conditions and result uncertainty up to high noise level and small detector size. Two experimental data sets are further exploited. First, a high-definition detector shows that crystal orientation uncertainty as low as 3×10−2degrees can be achieved, that is at least 80% less than commercial Hough-transformation based indexation method. Different sample tilt angles are tested, IDIC indexation proves much more tolerant with imprecise tilt angles than common EBSD indexation methods. Second, fast EBSD acquisitions with a coarse definition performed during an in-situ tensile test are analysed. A quantification of the residual noise allows one to formulate an optimized IDIC functional with a proper pixel-wise weight. With the latter refinement a two-pass procedure leads to a much enhanced precision of the determination of crystal orientation, giving access to more precise evaluation of maps of geometrically necessary dislocation densities.
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影响因子：
9.4
作者：
B. Gaskey;Ludwig Hendl;Xiaogang Wang;M. Seita
通讯作者：
B. Gaskey;Ludwig Hendl;Xiaogang Wang;M. Seita
DOI：
10.1002/9781118578469.ch6
发表时间：
2012-12
期刊：
--
影响因子：
--
作者：
M. Bornert;F. Hild;J. Orteu;S. Roux
通讯作者：
M. Bornert;F. Hild;J. Orteu;S. Roux
影响因子：
9.4
作者：
Yu-Feng Shen;R. Pokharel;T. Nizolek;Anilesh Kumar;T. Lookman
通讯作者：
Yu-Feng Shen;R. Pokharel;T. Nizolek;Anilesh Kumar;T. Lookman
DOI：
--
发表时间：
--
期刊：
--
影响因子：
--
作者：
通讯作者：
--
影响因子：
2.2
作者：
Q. Shi;S. Roux;F. Latourte;F. Hild
通讯作者：
Q. Shi;S. Roux;F. Latourte;F. Hild