A clustering approach to multireference alignment of single-particle projections in electron microscopy.
A clustering approach to multireference alignment of single-particle projections in electron microscopy.
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DOI：
10.1016/j.jsb.2010.03.011
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发表时间：
2010-08
影响因子：
3
通讯作者：
Carazo, J. M.
中科院分区：
文献类型：
--
作者：
Sorzano, C. O. S.;Bilbao-Castro, J. R.;Shkolnisky, Y.;Alcorlo, M.;Melero, R.;Caffarena-Fernandez, G.;Li, M.;Xu, G.;Marabini, R.;Carazo, J. M.
电子显微镜获取的单个粒子投影的二维分析是帮助识别数据集中存在的不同类型的投影及其不同投影方向的有用工具。这种分析也有助于区分不同种类的颗粒或不同的颗粒构象。本文介绍了一种新的二维多参考比对和分类算法，该算法基于基于相关熵的层次聚类方法(而不是更传统的相关性)和一种改进的聚类定义准则，特别适用于类间差异的信噪比较低的情况。我们表明，我们的算法比目前用于区分不同投影方向和不同粒子构象的方法具有更高的灵敏度。该算法可通过Xmipp软件包公开获得。
Two-dimensional analysis of projections of single particles acquired by an electron microscope is a useful tool to help identifying the different kinds of projections present in a dataset and their different projection directions. Such analysis is also useful to distinguish between different kinds of particles or different particle conformations. In this paper we introduce a new algorithm for performing two-dimensional multireference alignment and classification that is based on a Hierarchical clustering approach using correntropy (instead of the more traditional correlation) and a modified criterion for the definition of the clusters specially suited for cases in which the Signal-to-Noise Ratio of the differences between classes is low. We show that our algorithm offers an improved sensitivity over current methods in use for distinguishing between different projection orientations and different particle conformations. This algorithm is publicly available through the software package Xmipp.
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