Force Detection of Electromagnetic Chirality of Tightly Focused Laser Beams
Force Detection of Electromagnetic Chirality of Tightly Focused Laser Beams
复制标题
紧聚焦激光束电磁手性的力检测
DOI:
10.1021/acsphotonics.2c00261
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发表时间:
2022
期刊:
影响因子:
7
通讯作者:
Potma, Eric O.
中科院分区:
文献类型:
--
作者:
Sifat, Abid Anjum;Capolino, Filippo;Potma, Eric O.
We theoretically show that the optical chiral properties of tightly focused laser beams can be characterized by means of force detection. To measure the chiral properties of a beam of given handedness in the microscopic focal volume, we determine the photoinduced force exerted on a sharp tip, which is illuminated first by the beam of interest and second by an auxiliary beam of opposite handedness, in a sequential manner. We show that the difference between the force measurements is directly proportional to the chiral properties of the beam of interest. In particular, the gradient force difference Δ⟨Fgrad ,z⟩ is found to have exclusive correspondence to the time-averaged helicity density of the incident light, whereas the differential scattering force provides information about the spin angular momentum density of light. We further characterize and quantify the helicity-dependent Δ⟨Fgrad ,z⟩ using a Mie scattering formalism complemented with full wave simulations, underlining that the magnitude of the difference force is within an experimentally detectable range.
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DOI:
10.1002/0471785156
发表时间:
2006
期刊:
Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences
影响因子:
--
作者:
S. Denmark;J. Siegel
通讯作者:
J. Siegel
影响因子:
7
作者:
Zhao, Yang;Saleh, Amr A. E.;Dionne, Jennifer A.
通讯作者:
Dionne, Jennifer A.
影响因子:
7
作者:
M. Kamandi;M. Albooyeh;M. Veysi;M. Rajaei;J. Zeng;K. Wickramasinghe;F. Capolino
通讯作者:
M. Kamandi;M. Albooyeh;M. Veysi;M. Rajaei;J. Zeng;K. Wickramasinghe;F. Capolino
影响因子:
0.7
作者:
J. L. Trueba;A. Rañada
通讯作者:
A. Rañada
影响因子:
4
作者:
Rajapaksa, I.;Uenal, K.;Wickramasinghe, H. Kumar
通讯作者:
Wickramasinghe, H. Kumar