Cross-Lock: Dense Layout-Level Interconnect Locking using Cross-bar Architectures
Cross-Lock: Dense Layout-Level Interconnect Locking using Cross-bar Architectures
复制标题
交叉锁：使用交叉架构的密集布局级互连锁定
DOI：
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复制
发表时间：
2018
期刊：
影响因子：
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通讯作者：
Yier Jin
中科院分区：
文献类型：
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作者：
Kaveh Shamsi;Meng Li;D. Pan;Yier Jin
逻辑锁定是针对一系列硬件安全威胁的有吸引力的防御。但是，基于SAT，ATPG和模型检查等先进的布尔推理引擎（例如SAT，ATPG和模型检查）的甲骨文引导攻击使其难以牢固地锁定低开销的芯片。尽管大多数现有的锁定方案都集中在门级锁定上，但在本文中，我们提出了基于金属到金属可编程式VIA设备的跨频率的包含布局的互连锁定方案。我们演示了如何使用少量的物理钥匙线配置大型混淆键，该钥匙线导致零对小底物区域开销。与XOR/XOR/XNOR GATE-INSERTION锁定锁定相比，密集的SAT攻击弹性更好的SAT攻击弹性表明，密集的互连锁定的锁定顺序具有相同的密钥长度，该密钥长度具有更高的开销。
Logic locking is an attractive defense against a series of hardware security threats. However, oracle guided attacks based on advanced Boolean reasoning engines such as SAT, ATPG and model-checking have made it difficult to securely lock chips with low overhead. While the majority of existing locking schemes focus on gate-level locking, in this paper we present a layout-inclusive interconnect locking scheme based on cross-bars of metal-to-metal programmable-via devices. We demonstrate how this enables configuring a large obfuscation key with a small number of physical key wires contributing to zero to little substrate area overhead. Dense interconnect locking based on these circuit level primitives shows orders of magnitude better SAT attack resiliency compared to an XOR/XNOR gate-insertion locking with the same key length which has a much higher overhead.
DOI：
10.1109/iccad.2017.8203759
发表时间：
2017-11
期刊：
2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
影响因子：
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作者：
H. Zhou;Ruifeng Jiang;Shuyu Kong
通讯作者：
H. Zhou;Ruifeng Jiang;Shuyu Kong
DOI：
10.1145/3060403.3060469
发表时间：
2017-05
期刊：
Proceedings of the Great Lakes Symposium on VLSI 2017
影响因子：
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作者：
Yuanqi Shen;H. Zhou
通讯作者：
Yuanqi Shen;H. Zhou