A counting CdTe pixel detector for hard X-ray and /spl gamma/-ray imaging
A counting CdTe pixel detector for hard X-ray and /spl gamma/-ray imaging
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用于硬 X 射线和 /spl 伽马/射线成像的计数 CdTe 像素探测器
DOI：
10.1109/23.983249
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发表时间：
2001
影响因子：
1.8
通讯作者：
N. Wermes
中科院分区：
文献类型：
--
作者：
P. Fischer;M. Kouda;H. Krüger;A. Lindner;G. Sato;Tadayuki Takahashi;Shigeya Watanabe;N. Wermes
利用一种特殊的金钉技术，将一种厚度为0.5 mm、分辨率为1024像素的碲化镉（CdTe）半导体像素传感器与一种二维（2d）单光子计数像素读出芯片（MPEC 2.1）碰撞结合在一起。像素大小为200 /spl倍/ 200 /spl mu/m/sup 2/，活动面积为6.4 /spl倍/ 6.4 mm/sup 2/。演示了该高z成像像素器件的成功运行。报告了噪声和阈值色散以及成像性能。
A 0.5-mm-thick cadmium telluride (CdTe) semiconductor pixel sensor with 1024 pixels has been bump-bonded onto a two-dimensional (2-D) single photon counting pixel read out chip (MPEC 2.1) using a special gold-stud technique. The pixel size is 200 /spl times/ 200 /spl mu/m/sup 2/, the active area is 6.4 /spl times/ 6.4 mm/sup 2/. The successful operation of this high-Z imaging pixel device is demonstrated. Noise and threshold dispersion as well as the imaging performance are reported.
影响因子：
1.8
作者：
Takahashi, T;Watanabe, S
通讯作者：
Watanabe, S