A new X-ray fluorescence spectroscopy for extraterrestrial materials using a muon beam.
A new X-ray fluorescence spectroscopy for extraterrestrial materials using a muon beam.
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DOI:
10.1038/srep05072
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发表时间:
2014-05-27
影响因子:
4.6
通讯作者:
Uesugi M
中科院分区:
文献类型:
--
作者:
Terada K;Ninomiya K;Osawa T;Tachibana S;Miyake Y;Kubo MK;Kawamura N;Higemoto W;Tsuchiyama A;Ebihara M;Uesugi M
The recent development of the intense pulsed muon source at J-PARC MUSE, Japan Proton Accelerator Research Complex/MUon Science Establishment (106 s−1 for a momentum of 60 MeV/c), enabled us to pioneer a new frontier in analytical sciences. Here, we report a non-destructive elemental analysis using µ− capture. Controlling muon momentum from 32.5 to 57.5 MeV/c, we successfully demonstrate a depth-profile analysis of light elements (B, C, N, and O) from several mm-thick layered materials and non-destructive bulk analyses of meteorites containing organic materials. Muon beam analysis, enabling a bulk analysis of light to heavy elements without severe radioactivation, is a unique analytical method complementary to other non-destructive analyses. Furthermore, this technology can be used as a powerful tool to identify the content and distribution of organic components in future asteroidal return samples.
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DOI:
10.1016/j.nima.2008.11.016
发表时间:
2009-02-21
影响因子:
1.4
作者:
Miyake, Y.;Nishiyama, K.;Nagamine, K.
通讯作者:
Nagamine, K.
DOI:
10.1016/0168-583x(84)90338-0
发表时间:
1984-01-01
影响因子:
1.3
作者:
DANIEL, H
通讯作者:
DANIEL, H
DOI:
10.1007/s10967-008-1610-x
发表时间:
2008-12-01
影响因子:
1.6
作者:
Kubo, M. K.;Moriyama, H.;Nishiyama, K.
通讯作者:
Nishiyama, K.
影响因子:
2.9
作者:
Daniel, H;Hartmann, FJ;Naumann, RA
通讯作者:
Naumann, RA
影响因子:
5.2
作者:
Tanaka, Hiroyuki K. M.;Uchida, Tomohisa;Taira, Hideaki
通讯作者:
Taira, Hideaki