Prospects for out-of-plane magnetic field measurements through interference of electron vortex modes in the TEM
Prospects for out-of-plane magnetic field measurements through interference of electron vortex modes in the TEM
复制标题
通过 TEM 中电子涡旋模式的干涉进行面外磁场测量的前景
DOI：
10.1088/2040-8986/ab51fc
复制
发表时间：
2019
影响因子：
2.1
通讯作者：
Guzzinati G
中科院分区：
文献类型：
--
作者：
Guzzinati G
透射电子显微镜中的磁场绘图很常见，但所有传统方法仅提供垂直于电子轨迹的磁感应分量的投影。电子涡旋的最新实验进展表明，可以通过干涉测量法，使用专门制备的携带高轨道角动量 (OAM) 的电子涡旋态来绘制 TEM 设置中的面外磁感应强度。该方法依赖于电子穿过纵向场时所经历的阿哈罗诺夫-玻姆相移。在这里，我们展示了对于任何电子波函数如何自然地发生相同的效应，它总是可以被描述为 OAM 模式的叠加。这导致高 OAM 分波的出现与光束远场角分布中的方位角旋转量之间存在明显的联系。我们表明，可以通过更简单的设置来获得平面外磁场测量，该设置由具有方位角辐条的环形孔径组成。我们演示了实验设置并探索了磁场测量可实现的灵敏度。
Magnetic field mapping in transmission electron microscopy is commonplace, but all conventional methods provide only a projection of the components of the magnetic induction perpendicular to the electron trajectory. Recent experimental advances with electron vortices have shown that it is possible to map the out of plane magnetic induction in a TEM setup via interferometry with a specifically prepared electron vortex state carrying high orbital angular momentum (OAM). The method relies on the Aharonov–Bohm phase shift that the electron undergoes when going through a longitudinal field. Here we show how the same effect naturally occurs for any electron wave function, which can always be described as a superposition of OAM modes. This leads to a clear connection between the occurrence of high-OAM partial waves and the amount of azimuthal rotation in the far field angular distribution of the beam. We show that out of plane magnetic field measurement can thus be obtained with a much simpler setup consisting of a ring-like aperture with azimuthal spokes. We demonstrate the experimental setup and explore the achievable sensitivity of the magnetic field measurement.
影响因子：
2.2
作者：
Grillo, Vincenzo;Harris, Jeremie;Karimi, Ebrahim
通讯作者：
Karimi, Ebrahim
通过聚焦电子束诱导沉积生长的 Fe:O:C：磁和电特性
影响因子：
3.5
作者：
R. Lavrijsen;R. Córdoba;F. J. Schoenaker;T. Ellis;B. Barcones;J. T. Kohlhepp;H. Swagten;B. Koopmans;J. D. de Teresa;C. Magén;M. Ibarra;P. Trompenaars;J. Mulders
通讯作者：
J. Mulders
透射电子显微镜
DOI：
10.1007/978-3-319-26651-0_3
发表时间：
2016
期刊：
--
影响因子：
--
作者：
Burke M
通讯作者：
Burke M