Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals
Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals
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Cu2ZnSnSe4 块状晶体的光谱椭圆光度研究
DOI：
10.1063/1.4892548
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发表时间：
2014
影响因子：
4
通讯作者：
E. Arushanov
中科院分区：
文献类型：
--
作者：
M. León;S. Levcenko;R. Serna;I. Bodnar;A. Nateprov;M. Guc;G. Gurieva;N. López;J. Merino;R. Caballero;S. Schorr;A. Pérez‐Rodríguez;E. Arushanov
使用光谱椭圆光度法，我们研究并分析了通过布里奇曼方法生长的 Cu2ZnSnSe4 块状晶体在 0.8–4.5eV 光子能量范围内的赝光学常数。在复杂赝介电函数的光谱中发现的结构与 E0、E1A 和 E1B 带间跃迁相关，并在 Adachi 模型的框架中进行了分析。使用模拟退火算法评估了强度、阈值能量和展宽等带间跃迁参数。此外，还导出了 0.8–4.5eV 光子能量范围内的赝复折射率、消光系数、吸收系数和法向入射反射率。
Using spectroscopic ellipsometry we investigated and analyzed the pseudo-optical constants of Cu2ZnSnSe4 bulk crystals, grown by the Bridgman method, over 0.8–4.5 eV photon energy range. The structures found in the spectra of the complex pseudodielectric functions were associated to E0, E1A, and E1B interband transitions and were analyzed in frame of the Adachi's model. The interband transition parameters such as strength, threshold energy, and broadening were evaluated by using the simulated annealing algorithm. In addition, the pseudo-complex refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity were derived over 0.8–4.5 eV photon energy range.
影响因子：
4
作者：
Luckert, F.;Hamilton, D. I.;Martin, R. W.
通讯作者：
Martin, R. W.