Test data compression using dictionaries with fixed-length indices [SOC testing]
Test data compression using dictionaries with fixed-length indices [SOC testing]
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使用具有固定长度索引的字典测试数据压缩[SOC 测试]
DOI：
10.1109/vtest.2003.1197654
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发表时间：
2003
期刊：
影响因子：
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通讯作者：
K. Chakrabarty
中科院分区：
文献类型：
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作者：
Lei Li;K. Chakrabarty
我们提出了一种基于字典的测试数据压缩方法，用于减少SOC中的测试数据量和测试时间。所提出的方法是基于使用少数ATE通道从测试仪到芯片的压缩测试模式，并在测试电路中驱动大量内部扫描链。因此，它特别适用于减少的销钉计数和低成本DFT测试环境，在该环境中，测试仪和SOC之间的狭窄界面是可取的。基于字典的方法不仅减少了测试时间，而且还消除了SOC和ATE之间对额外同步和握手的需求。字典条目是在压缩过程中确定的，通过求解图理论中著名的集团分区问题的变体。 IBM的ISCAS-89基准和代表性测试数据的实验结果表明，该提出的方法的表现优于许多最近提供的测试数据压缩技术。
We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of ATE channels to deliver compressed test patterns from the tester to the chip and to drive a large number of internal scan chains in the circuit under test. Therefore, it is especially suitable for a reduced pin-count and low-cost DFT test environment, where a narrow interface between the tester and the SOC is desirable. The dictionary-based approach not only reduces testing time but it also eliminates the need for additional synchronization and handshaking between the SOC and the ATE. The dictionary entries are determined during the compression procedure by solving a variant of the well-known clique partitioning problem from graph theory. Experimental results for the ISCAS-89 benchmarks and representative test data from IBM show that the proposed method outperforms a number of recently-proposed test data compression techniques.
DOI：
10.1109/vts.2002.1011119
发表时间：
2002-04
期刊：
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)
影响因子：
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作者：
S. Reddy;K. Miyase;S. Kajihara;I. Pomeranz
通讯作者：
S. Reddy;K. Miyase;S. Kajihara;I. Pomeranz