Experimental research on the relationship between bypass diode configuration of photovoltaic module and hot spot generation
Experimental research on the relationship between bypass diode configuration of photovoltaic module and hot spot generation
复制标题
光伏组件旁路二极管配置与热点产生关系的实验研究
DOI:
10.1088/1674-4926/39/12/124014
复制
发表时间:
2018-12
影响因子:
5.1
通讯作者:
Cong Gao
中科院分区:
文献类型:
--
作者:
Cong Gao
A hot spot is a reliability problem in photovoltaic (PV) modules where a mismatched or shaded cell heats up significantly and degrades the PV module output power performance. High PV cell temperature due to a hot spot can damage the cell encapsulate and lead to second breakdown, which both cause permanent damage to the PV module. In present systems, bypass diodes are used to mitigate the hot spot problem. In this work, five commercial polysilicon PV modules configured with different numbers of bypass diodes are used to study the influence of bypass diodes on the reverse bias voltage of a shaded cell and the resulting hot spot phenomenon. The reverse bias voltage of the shaded cell, and the hot spot probability and severity decrease as the number of bypass diodes increases. Negative terminal voltage of a shaded cell accompanied by a switched-off bypass diode are the necessary condition for hot spot generation. In an extreme case where each cell has an individual bypass diode in a PV module, it still cannot avoid the hazards of a hot spot under the shading areas of 5–7 cm2, but the probability of a hot spot is reduced to a minimum of 0.41%.
登录
查看更多内容
影响因子:
6.7
作者:
Kim, Katherine A.;Seo, Gab-Su;Krein, Philip T.
通讯作者:
Krein, Philip T.
影响因子:
8.7
作者:
Dhimish, Mahmoud;Holmes, Violeta;Zhang, Li
通讯作者:
Zhang, Li
影响因子:
6.9
作者:
Dhimish, Mahmoud;Holmes, Violeta;Sibley, Martin
通讯作者:
Sibley, Martin
影响因子:
3.9
作者:
Dhimish, Mahmoud;Holmes, Violeta;Mather, Peter
通讯作者:
Mather, Peter
影响因子:
3.2
作者:
S. Wasmer;N. Rajsrima;I. Geisemeyer;F. Fertig;J. Greulich;S. Rein
通讯作者:
S. Wasmer;N. Rajsrima;I. Geisemeyer;F. Fertig;J. Greulich;S. Rein