On the spectral difference between electroluminescence and photoluminescence of Si nanocrystals: a mechanism study of electroluminescence
On the spectral difference between electroluminescence and photoluminescence of Si nanocrystals: a mechanism study of electroluminescence
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硅纳米晶电致发光与光致发光的光谱差异：电致发光机理研究
DOI：
10.1007/s11051-013-2063-x
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发表时间：
2013-10
影响因子：
2.5
通讯作者：
Lu, Ming
中科院分区：
文献类型：
--
作者：
Chen, Jia-Rong;Zhu, Jiang;Lu, Chen-Tian;Lu, Ming
硅纳米晶（Si-nc）的电致发光（EL）谱相对于其光致发光（PL）谱的峰位发生了位移，特别是蓝移。对于不同的电致发光机制，光谱差异的解释是不同的。为了获得EL过程的相关图像，在这项工作中，我们分析了目前主要应用的三种EL机制，即，缺陷发光模型、能带填充模型和载流子能量选择Si-nc尺寸模型。根据三种模型的预测结果，设计了不同的硅纳米晶样品和工作条件，并对样品的电致发光和光致发光进行了监测。得出的结论是，所观察到的EL主要是Si-NC相关的起源。实验结果更符合Si-nc尺寸选择模型。
Spectral shift, especially blueshift, in peak position of electroluminescence (EL) spectrum of Si nanocrystal (Si-nc) with respect to its photoluminescence (PL) counterpart has been often observed. Explanations for the spectral difference are different for different EL mechanisms adopted. To gain a relevant picture of the EL process, in this work, we analyze three EL mechanisms that are mainly applied nowadays, i.e., the model of defect light emission, that of band-filling, and that of Si-nc size selection by the carrier energy. Different Si-nc samples and working conditions are designed and their EL and PL emissions monitored according to the predictions of the three models. It is concluded that the observed EL is mainly of Si-nc-related origin. The experimental results are more consistent with the model of Si-nc size selection.
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影响因子：
38.3
作者：
U. Gösele
通讯作者：
U. Gösele
影响因子：
64.8
作者：
Lorenzo Pavesi;L. D. Negro;C. Mazzoleni;G. Franzò;F. Priolo
通讯作者：
Lorenzo Pavesi;L. D. Negro;C. Mazzoleni;G. Franzò;F. Priolo
影响因子：
--
作者：
Li D;Chen YB;Ren Y;Zhu J;Zhao YY;Lu M
通讯作者：
Lu M
影响因子：
1.4
作者：
Keisuke Sato;K. Hirakuri
通讯作者：
Keisuke Sato;K. Hirakuri
DOI：
10.1007/s003390101019
发表时间：
2002
期刊：
Applied Physics A
影响因子：
--
作者：
G. Franzò;A. Irrera;E. C. Moreira;M. Miritello;F. Iacona;D. Sanfilippo;G. Stefano;P. Fallica;F. Priolo
通讯作者：
G. Franzò;A. Irrera;E. C. Moreira;M. Miritello;F. Iacona;D. Sanfilippo;G. Stefano;P. Fallica;F. Priolo