Multiview Visibility Estimation for Image-Based Modeling
Multiview Visibility Estimation for Image-Based Modeling
复制标题
基于图像建模的多视图可见性估计
DOI:
10.1007/s11390-011-1196-6
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发表时间:
2011-11
影响因子:
0.7
通讯作者:
JIA Yunde
中科院分区:
文献类型:
--
作者:
ZHANG Liuxin;PEI Mingtao;JIA Yunde
In this paper, we investigate the problem of determining regions in 3D scene visible to some given viewpoints when obstacles are present in the scene. We assume that the obstacles are composed of some opaque objects with closed surfaces. The problem is formulated in an implicit framework where the obstacles are represented by a level set function. The visible and invisible regions of the given viewpoints are determined through an efficient implicit ray tracing technique. As an extension of our approach, we apply the multiview visibility estimation to an image-based modeling technique. The unknown scene geometry and multiview visibility information are incorporated into a variational energy functional. By minimizing the energy functional, the true scene geometry as well as the accurate visibility information of the multiple views can be recovered from a number of scene images. This makes it feasible to handle the visibility problem of multiple views by our approach when the true scene geometry is unknown.
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影响因子:
10.6
作者:
Chan, TF;Vese, LA
通讯作者:
Vese, LA
DOI:
10.1109/cvpr.2005.238
发表时间:
2005-06
期刊:
2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'05)
影响因子:
--
作者:
George Vogiatzis;P. Torr;R. Cipolla
通讯作者:
George Vogiatzis;P. Torr;R. Cipolla
DOI:
10.1109/cvpr.2003.1211351
发表时间:
2003-06
期刊:
2003 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, 2003. Proceedings.
影响因子:
--
作者:
Hailin Jin;Stefano Soatto;A. Yezzi
通讯作者:
Hailin Jin;Stefano Soatto;A. Yezzi
影响因子:
0.8
作者:
W. Chin;S. Ntafos
通讯作者:
W. Chin;S. Ntafos
DOI:
10.1145/1198555.1198751
发表时间:
2005-07
期刊:
ACM SIGGRAPH 2005 Courses
影响因子:
--
作者:
S. Parker;William Martin;Peter-Pike J. Sloan;P. Shirley;Brian E. Smits;C. Hansen
通讯作者:
S. Parker;William Martin;Peter-Pike J. Sloan;P. Shirley;Brian E. Smits;C. Hansen