Modelling of Auger-induced DNA damage by incorporated 125I.
Modelling of Auger-induced DNA damage by incorporated 125I.
复制标题
通过掺入 125I 来模拟俄歇诱导的 DNA 损伤。
作者：
Hooshang Nikjoo;R. F. Martin;David E. Charlton;Michel Terrissol;Sivamany Kandaiya;P. Lobachevsky
我们分析了一个新的可用的高分辨率和精度重复原始马丁和Haseltine实验，其中包括DMSO的影响的结果。新模型包括自由基物种的产生和扩散以及.OH自由基对DNA的攻击和直接命中。单链断裂的计算使用单个俄歇电子沿着电子和自由基物质的轨道叠加在B-DNA的原子模型上。初步计算与实验的比较支持早期选择的数据的量所需的能量产生单链断裂，即17.5 eV。在一个单独的模拟中，我们发现，平均不到两个电离诱导单链断裂给出了最好的拟合实验数据。研究发现，直接撞击主要发生在近距离，而.OH自由基造成的损害主要是远距离类型。
We have analyzed a newly available high resolution and precision repeat of the original Martin and Haseltine experiment which includes the influence of DMSO on the results. The new model includes the production and diffusion of radical species and .OH radical attack on DNA as well as the direct hits. Calculations of single-strand breaks use individual Auger electron along with the tracks of electrons and radical species superimposed on an atomistic model of B-DNA. Comparison of the preliminary calculations with the experiment supports the earlier choice of data for the amount of energy required to produce a single-strand break, i.e. 17.5 eV. In a separate simulation we found that an average of less than two ionizations inducing a single-strand break gave the best fit to experimental data. Direct hits were found to be predominantly occurring at short range while the damage by .OH radicals was mainly of the long-range type.
125I 核衰变与细胞质衰变的生物学后果：半胱胺作为体内俄歇级联的辐射保护剂。
影响因子：
3.4
作者：
Rao,DV;Narra,VR;Howell,RW;Sastry,KS
通讯作者：
Sastry,KS
影响因子：
56.9
作者：
MARTIN, RF;HASELTINE, WA
通讯作者：
HASELTINE, WA