Determination of charge injection barrier using the displacement current measurement technique
Determination of charge injection barrier using the displacement current measurement technique
复制标题
使用位移电流测量技术确定电荷注入势垒
DOI:
10.1016/j.orgel.2016.04.029
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发表时间:
2016
期刊:
影响因子:
--
通讯作者:
S. Sato
中科院分区:
文献类型:
--
作者:
H. Tajima;F. Miyao;M. Mizukoshi;S. Sato
A new technique to determine the injection barrier using displacement current measurement (DCM) is reported. This technique was applied to junctions of metal-free phthalocyanine (H2Pc)/Ag and H2Pc/MoO3/Ag. The injection barriers from Ag to the highest occupied molecular orbital of H2Pc and to the lowest unoccupied molecular orbital of H2Pc were evaluated and found to be 0.4 V and 1.8 V, respectively. No barrier was formed for the hole injection from the MoO3/Ag electrode into H2Pc. These results are relatively consistent with an energy diagram built on the basis of the ionization energy for H2Pc, Ag, and MoO3, in addition to the electron affinity for H2Pc.
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影响因子:
2.3
作者:
Zahn, Dietrich R. T.;Gavrila, Gianina N.;Gorgoi, Mihaela
通讯作者:
Gorgoi, Mihaela
DOI:
--
发表时间:
2003
期刊:
Jpn. J. Appl. Phys. 42
影响因子:
--
作者:
N.Abiko;S.Ogawa;Naofumi Abiko;Satoshi Ogawa;N.Abiko;S.Ogawa;T.Nishikawa;S.Ogawa;Koshi Okamura;石井 久夫;H.Ishii;S.Ogawa;Y.Hosoi;T.Nishikawa;K.Okamura;H.Ishii;H.Ishii;S.Ogawa;S.Ogawa;H.Ishii;石井 久夫;Koshi Okamura;石井 久夫;小川 賢;H.Ishii;K.Sugi;K.Okamura;H.Ishii;S.Ogawa;H.Ishii;K.Sugi;K.Okamura;K.Okamura;K.Sugi;小川 賢;石井久夫;岡村 康史;小川 賢;杉 啓司;H.Ishii;K.Sugi;S.Ogawa;S.Ogawa
通讯作者:
S.Ogawa
影响因子:
1.5
作者:
S. Egusa;A. Miura;Nobuhiro Azuma
通讯作者:
Nobuhiro Azuma
DOI:
--
发表时间:
2015
期刊:
影响因子:
--
作者:
Sungyeop Jung;Chang‐Hyun Kim;Y. Bonnassieux;G. Horowitz
通讯作者:
G. Horowitz
影响因子:
2.1
作者:
K. Seki;T. Tani;H. Ishii
通讯作者:
H. Ishii