Analysis and testing of total ionizing dose effect on several commercial optical transceivers via gamma-ray radiation
Analysis and testing of total ionizing dose effect on several commercial optical transceivers via gamma-ray radiation
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通过伽马射线辐射对几种商用光收发器的总电离剂量效应进行分析和测试
DOI：
10.3788/col201917.052302
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发表时间：
2019-05
影响因子：
3.5
通讯作者：
Wang Liqian
中科院分区：
文献类型：
--
作者：
Zhan Yueying;He Jianhua;Wang Fei;Wang Liqian
在我们的信中，我们选择了几款商用光收发器，包括单通道收发模块、并行发送和接收模块以及以太网无源光网络（EPON）光线路终端（奥尔特）和光网络单元（ONU）模块，通过伽马射线辐射方法进行总电离剂量（TID）测试。讨论和分析了光收发器的电流和接收灵敏度的变化。基于在约0.1rad（Si）/s的剂量率下暴露于50 krad（Si）的TID的TID测试，在50 krad（Si）暴露后，单通道收发器和并行接收模块的性能没有改变，并行发送和EPON ONU模块在40 krad（Si）和47 krad（Si）暴露后没有工作，EPON奥尔特模块在辐照过程中出现误码，经过退火处理后仍能正常工作，分析了奥尔特出现误码的原因。最后，根据理论分析和测试结果，提出了提高光收发模块可靠性的设计建议，可供各种航天任务的卫星系统设计参考。
In our Letter, we selected several commercial optical transceivers, which consist of single-channel transceiver modules, parallel transmitting and receiving modules, and Ethernet passive optical network (EPON) optical line terminal (OLT) and optical network unit (ONU) modules, to do the total ionizing dose (TID) testing via the gamma-ray radiation method. The changing of current and receiver sensitivity of optical transceivers is discussed and analyzed. Based on the TID testing exposed to a TID of 50 krad (Si) at a dose rate of about 0.1 rad (Si)/s, the performance of single-channel transceivers and parallel receiving modules has not changed after 50 krad (Si) exposure, the parallel transmitting and EPON ONU modules have not worked after 40 krad (Si) and 47 krad (Si) exposure, the EPON OLT module has bit error in the process of irradiation, and it can work well after annealing; the reason for the error of OLT is analyzed. Finally, based on the theoretical analysis and testing results, this Letter provides several design suggestions to improve the reliability for optical transceivers, which can be referenced by satellite system designation for various space missions.
DOI：
10.25560/12870
发表时间：
2013-04
期刊：
--
影响因子：
--
作者：
P. Stejskal
通讯作者：
P. Stejskal