Superficial dosimetry imaging of Čerenkov emission in electron beam radiotherapy of phantoms.

Superficial dosimetry imaging of Čerenkov emission in electron beam radiotherapy of phantoms.
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DOI:
10.1088/0031-9155/58/16/5477
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发表时间:
2013-08-21
影响因子:
3.5
通讯作者:
Pogue BW
Pogue BW
中科院分区:
工程技术2区
文献类型:
--
作者:
Zhang R;Fox CJ;Glaser AK;Gladstone DJ;Pogue BW

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切伦科夫发射是由能量高于 264keV 的组织中的电离辐射产生的。这项研究首次对这种光发射作为吸收表面剂量的替代物进行了检查。切伦科夫发射是从用电子照射的平面组织模型表面成像的,使用的场尺寸范围为 6cm×6cm 至 20cm×20cm,入射角为 0 至 50 度,能量为 6 至 18 MeV。将切连科夫图像与通过直接二极管测量以及蒙特卡罗和治疗计划系统计算得出的模型中估计的表面剂量进行比较。对于 6MeV 至 18MeV 的能量,强度图像与已知剂量的参考数据表现出出色的线性一致性 (R2=0.97)。当进行正交传递时,平面内和跨平面剂量分布比较表明,与切伦科夫光成像相比,不同估计方法之间的差异非常小(±2~4%差异)。对于50度的入射角,切伦科夫图像和蒙特卡罗模拟与二极管数据表现出极好的一致性,但治疗计划系统(TPS)的误差较大(OPT=±1~2%,Diode=±2~3%,TPS=±6~8%差异),正如预期的那样。基于切伦科夫辐射的浅表剂量测量的采样深度已在分层皮肤模型中进行了模拟,显示了通过光谱滤波调节采样深度的潜力。总而言之,这些测量和模拟表明,切伦科夫发射成像可能为从入射放射治疗电子束进行表面剂量测定成像提供了一种有价值的方法。
Čerenkov emission is generated from ionizing radiation in tissue above 264keV energy. This study presents the first examination of this optical emission as a surrogate for the absorbed superficial dose. Čerenkov emission was imaged from the surface of flat tissue phantoms irradiated with electrons, using a range of field sizes from 6cm×6cm to 20cm×20cm, incident angles from 0 to 50 degrees, and energies from 6 to 18 MeV. The Čerenkov images were compared with estimated superficial dose in phantoms from direct diode measurements, as well as calculations by Monte Carlo and the treatment planning system. Intensity images showed outstanding linear agreement (R2=0.97) with reference data of the known dose for energies from 6MeV to 18MeV. When orthogonal delivery was done, the in-plane and cross-plane dose distribution comparisons indicated very little difference (±2~4% differences) between the different methods of estimation as compared to Čerenkov light imaging. For an incident angle 50 degrees, the Čerenkov images and Monte Carlo simulation show excellent agreement with the diode data, but the treatment planning system (TPS) had at a larger error (OPT=±1~2%, Diode=±2~3%, TPS=±6~8% differences) as would be expected. The sampling depth of superficial dosimetry based on Čerenkov radiation has been simulated in layered skin model, showing the potential of sampling depth tuning by spectral filtering. Taken together, these measurements and simulations indicate that Čerenkov emission imaging might provide a valuable way to superficial dosimetry imaging from incident radiotherapy beams of electrons.
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