Hardening AES Hardware Implementations Against Fault and Error Inject Attacks
Hardening AES Hardware Implementations Against Fault and Error Inject Attacks
复制标题
强化 AES 硬件实施以抵御故障和错误注入攻击
DOI:
10.1145/3194554.3194649
复制
发表时间:
2018
期刊:
影响因子:
--
通讯作者:
Kinsy, Michel A.
中科院分区:
文献类型:
--
作者:
Bu, Lake;Kinsy, Michel A.
The Advanced Encryption Standard (AES) enables secure transmission of confidential messages. Since its invention, there have been many proposed attacks against the scheme. For example, one can inject errors or faults to acquire the encryption keys. It has been shown that the AES algorithm itself does not provide a protection against these types of attacks. Therefore, additional techniques like error control codes (ECCs) have been proposed to detect active attacks. However, not all the proposed solutions show the adequate efficacy. For instance, linear ECCs have some critical limitations, especially when the injected errors are beyond their fault detection or tolerance capabilities. In this paper, we propose a new method based on a non-linear code to protect all four internal stages of the AES hardware implementation. With this method, the protected AES system is able to (a) detect all multiplicity of errors with a high probability and (b) correct them if the errors follow certain patterns or frequencies. Results shows that the proposed method provides much higher security and reliability to the AES hardware implementation with minimal overhead.
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DOI:
10.1007/11889700_17
发表时间:
2006
期刊:
2009 IEEE/IFIP International Conference on Dependable Systems & Networks
影响因子:
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作者:
Konrad J. Kulikowski;M. Karpovsky;A. Taubin
通讯作者:
A. Taubin
DOI:
10.1109/fdtc.2008.13
发表时间:
2008
期刊:
2008 5th Workshop on Fault Diagnosis and Tolerance in Cryptography
影响因子:
--
作者:
Konrad J. Kulikowski;Zhen Wang;M. Karpovsky
通讯作者:
M. Karpovsky
DOI:
10.1007/11889700_16
发表时间:
2006-10
期刊:
--
影响因子:
--
作者:
G. Gaubatz;B. Sunar;M. Karpovsky
通讯作者:
G. Gaubatz;B. Sunar;M. Karpovsky
DOI:
10.1109/dftvs.2005.41
发表时间:
2005
期刊:
20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)
影响因子:
--
作者:
L. Breveglieri;I. Koren;P. Maistri
通讯作者:
P. Maistri
DOI:
10.1109/dsn.2009.5270297
发表时间:
2009
期刊:
2009 IEEE/IFIP International Conference on Dependable Systems & Networks
影响因子:
--
作者:
Zhen Wang;M. Karpovsky;Konrad J. Kulikowski
通讯作者:
Konrad J. Kulikowski