Monitoring of Brazilian wheat blast field populations reveals resistance to QoI, DMI, and SDHI fungicides
Monitoring of Brazilian wheat blast field populations reveals resistance to QoI, DMI, and SDHI fungicides
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对巴西小麦稻瘟病田群体的监测揭示了对 QoI、DMI 和 SDHI 杀菌剂的抗性
DOI:
10.1111/ppa.13470
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发表时间:
2021
期刊:
影响因子:
2.7
通讯作者:
Vicentini S
中科院分区:
文献类型:
--
作者:
Vicentini S
Wheat blast is one of the most important and devastating fungal diseases of wheat in South America, South‐east Asia, and now in southern Africa. The disease can reduce grain yield by up to 70% and is best controlled using integrated disease management strategies. The difficulty in disease management is compounded by the lack of durable host resistance and the ineffectiveness of fungicide sprays. New succinate dehydrogenase inhibitor (SDHI) fungicides were recently introduced for the management of wheat diseases. Brazilian field populations of the wheat blast pathogenPyricularia oryzae Triticumlineage (PoTl) sampled from different geographical regions in 2012 and 2018 were shown to be resistant to both QoI (strobilurin) and DMI (azole) fungicides. The main objective of the current study was to determine the SDHI baseline sensitivity in these populations. Moderate levels of SDHI resistance were detected in five out of the six field populations sampled in 2012 and in most of the strains isolated in 2018. No association was found between target site mutations in thesdhB,sdhC, andsdhDgenes and the levels of SDHI resistance, indicating that a pre‐existing resistance mechanism not associated with target site mutations is probably present in Brazilian wheat blast populations.
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影响因子:
2.5
作者:
Cruz, Maria Fernanda A.;Prestes, Ariano M.;Scheeren, Pedro L.
通讯作者:
Scheeren, Pedro L.
影响因子:
4.1
作者:
Rehfus, Alexandra;Miessner, Simone;Stammler, Gerd
通讯作者:
Stammler, Gerd
影响因子:
2.7
作者:
Cruz, C. D.;Kiyuna, J.;Valent, B.
通讯作者:
Valent, B.
影响因子:
--
作者:
J. Rocha;Adérico Júnior Badaró Pimentel;Guilherme Ribeiro;Moacil Alves de Souza
通讯作者:
Moacil Alves de Souza
影响因子:
1.8
作者:
C. A. Pizolotto;J. Maciel;J. M. Fernandes;W. Boller
通讯作者:
W. Boller